A High Precision On-Line Detection Method for IGBT Junction Temperature Based on Stepwise Regression Algorithm
The insulated gate bipolar transistor (IGBT), one of the most vulnerable component, is one of the most precious central component in the converter interior. High junction temperature will lead to device failure, which is the main reason of failure of power electronic system. Therefore, on-line high...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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IEEE
2020-01-01
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| Series: | IEEE Access |
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| Online Access: | https://ieeexplore.ieee.org/document/9214524/ |
| _version_ | 1819275686344392704 |
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| author | Lingfeng Shao Yi Hu Guoqing Xu |
| author_facet | Lingfeng Shao Yi Hu Guoqing Xu |
| author_sort | Lingfeng Shao |
| collection | DOAJ |
| description | The insulated gate bipolar transistor (IGBT), one of the most vulnerable component, is one of the most precious central component in the converter interior. High junction temperature will lead to device failure, which is the main reason of failure of power electronic system. Therefore, on-line high precision measurement of IGBT module junction temperature is the basis of life prediction and reliability evaluation of high-power power conversion equipment. In this paper, the principle of IGBT junction temperature extraction and the latest development of related technologies are summarized. In particular, the working principle and shortcomings of temperature sensitive electrical parameter (TSEP) method are summarized. The change of junction temperature will affect the inter-electrode capacitance in the internal structure of IGBT, which will cause the change of temperature sensitive electrical parameters. The single temperature sensitive electrical parameter method is easily affected by IGBT structure and inter-electrode capacitance. This paper presents an algorithm for high precision on-line detection of IGBT junction temperature. The parameter types are optimized by stepwise regression and the model is established accordingly. In this paper, IGBT: FF50R12RT4 is used as the experimental equipment. By comparing the junction temperature model established based on multiple linear stepwise regression algorithm with the junction temperature model based on traditional temperature sensitive electrical parameters, it is proved that the algorithm has better fitting degree and precision, and the algorithm can be used for high precision online extraction of junction temperature. |
| first_indexed | 2024-12-23T23:28:16Z |
| format | Article |
| id | doaj.art-f0055a96ac204503ae91e2204a543385 |
| institution | Directory Open Access Journal |
| issn | 2169-3536 |
| language | English |
| last_indexed | 2024-12-23T23:28:16Z |
| publishDate | 2020-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj.art-f0055a96ac204503ae91e2204a5433852022-12-21T17:26:09ZengIEEEIEEE Access2169-35362020-01-01818617218618010.1109/ACCESS.2020.30289049214524A High Precision On-Line Detection Method for IGBT Junction Temperature Based on Stepwise Regression AlgorithmLingfeng Shao0https://orcid.org/0000-0001-6744-8844Yi Hu1Guoqing Xu2https://orcid.org/0000-0002-3582-0856School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, ChinaSchool of Mechatronic Engineering and Automation, Shanghai University, Shanghai, ChinaSchool of Mechatronic Engineering and Automation, Shanghai University, Shanghai, ChinaThe insulated gate bipolar transistor (IGBT), one of the most vulnerable component, is one of the most precious central component in the converter interior. High junction temperature will lead to device failure, which is the main reason of failure of power electronic system. Therefore, on-line high precision measurement of IGBT module junction temperature is the basis of life prediction and reliability evaluation of high-power power conversion equipment. In this paper, the principle of IGBT junction temperature extraction and the latest development of related technologies are summarized. In particular, the working principle and shortcomings of temperature sensitive electrical parameter (TSEP) method are summarized. The change of junction temperature will affect the inter-electrode capacitance in the internal structure of IGBT, which will cause the change of temperature sensitive electrical parameters. The single temperature sensitive electrical parameter method is easily affected by IGBT structure and inter-electrode capacitance. This paper presents an algorithm for high precision on-line detection of IGBT junction temperature. The parameter types are optimized by stepwise regression and the model is established accordingly. In this paper, IGBT: FF50R12RT4 is used as the experimental equipment. By comparing the junction temperature model established based on multiple linear stepwise regression algorithm with the junction temperature model based on traditional temperature sensitive electrical parameters, it is proved that the algorithm has better fitting degree and precision, and the algorithm can be used for high precision online extraction of junction temperature.https://ieeexplore.ieee.org/document/9214524/Temperature sensitive electrical parameterson-line junction temperature extractionstepwise regressioninsulated gate bipolar transistorreliabilitycondition monitoring |
| spellingShingle | Lingfeng Shao Yi Hu Guoqing Xu A High Precision On-Line Detection Method for IGBT Junction Temperature Based on Stepwise Regression Algorithm IEEE Access Temperature sensitive electrical parameters on-line junction temperature extraction stepwise regression insulated gate bipolar transistor reliability condition monitoring |
| title | A High Precision On-Line Detection Method for IGBT Junction Temperature Based on Stepwise Regression Algorithm |
| title_full | A High Precision On-Line Detection Method for IGBT Junction Temperature Based on Stepwise Regression Algorithm |
| title_fullStr | A High Precision On-Line Detection Method for IGBT Junction Temperature Based on Stepwise Regression Algorithm |
| title_full_unstemmed | A High Precision On-Line Detection Method for IGBT Junction Temperature Based on Stepwise Regression Algorithm |
| title_short | A High Precision On-Line Detection Method for IGBT Junction Temperature Based on Stepwise Regression Algorithm |
| title_sort | high precision on line detection method for igbt junction temperature based on stepwise regression algorithm |
| topic | Temperature sensitive electrical parameters on-line junction temperature extraction stepwise regression insulated gate bipolar transistor reliability condition monitoring |
| url | https://ieeexplore.ieee.org/document/9214524/ |
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