Percolative, Multifractal, and Symmetry Properties of the Surface at Nanoscale of Cu-Ni Bimetallic Thin Films Deposited by RF-PECVD

Percolative, Multifractal, and Symmetry Properties of the Surface at Nanoscale of Cu-Ni Bimetallic Thin Films Deposited by RF-PECVD

We explored the morphological and 3D spatial properties of Cu/Ni thin films obtained by a co-deposition process. The 3D AFM topographic maps analysis indicated that the films displayed different morphologies and rough profiles dictated by their singular directional inhomogeneities. Moreover, Minkows...

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Bibliographic Details
Main Authors: Robert S. Matos, Nilson S. Ferreira, Ştefan Ţălu, Atefeh Ghaderi, Shahram Solaymani, Marcelo A. Pires, Edgar Aparecido Sanches, Henrique D. da Fonseca Filho
Format: Article
Language:English
Published: MDPI AG 2022-12-01
Series:Symmetry
Subjects:
AFM
Cu-Ni
fractal
multifractal
scaling symmetry
thin films
Online Access:https://www.mdpi.com/2073-8994/14/12/2675

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https://www.mdpi.com/2073-8994/14/12/2675

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