High brightness ultrafast transmission electron microscope based on a laser-driven cold-field emission source: principle and applications
We report on the development of an ultrafast Transmission Electron Microscope based on a laser-driven cold-field emission source. We first describe the instrument before reporting on numerical simulations of the laser-driven electron emission. These simulations predict the temporal and spectral prop...
| প্রধান লেখক: | , , , , |
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| বিন্যাস: | প্রবন্ধ |
| ভাষা: | English |
| প্রকাশিত: |
Taylor & Francis Group
2019-01-01
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| মালা: | Advances in Physics: X |
| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | http://dx.doi.org/10.1080/23746149.2019.1660214 |