All-inorganic perovskite quantum dot light-emitting memories

Electric field induced ion migration is a well-known phenomenon in perovskite, but the consequences are notorious, and thus needs to be prevented. Here, on the other hand, the authors cleverly manipulate this event for realising resistive random-access memory and light-emitting electrochemical cell...

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Main Authors: Meng-Cheng Yen, Chia-Jung Lee, Kang-Hsiang Liu, Yi Peng, Junfu Leng, Tzu-Hsuan Chang, Chun-Chieh Chang, Kaoru Tamada, Ya-Ju Lee
Format: Article
Language:English
Published: Nature Portfolio 2021-07-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-021-24762-w
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author Meng-Cheng Yen
Chia-Jung Lee
Kang-Hsiang Liu
Yi Peng
Junfu Leng
Tzu-Hsuan Chang
Chun-Chieh Chang
Kaoru Tamada
Ya-Ju Lee
author_facet Meng-Cheng Yen
Chia-Jung Lee
Kang-Hsiang Liu
Yi Peng
Junfu Leng
Tzu-Hsuan Chang
Chun-Chieh Chang
Kaoru Tamada
Ya-Ju Lee
author_sort Meng-Cheng Yen
collection DOAJ
description Electric field induced ion migration is a well-known phenomenon in perovskite, but the consequences are notorious, and thus needs to be prevented. Here, on the other hand, the authors cleverly manipulate this event for realising resistive random-access memory and light-emitting electrochemical cell in one device based on CsPbBr3 quantum dots.
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spelling doaj.art-f1155131f73a4d929c2706f0c0f8bae32022-12-21T19:10:26ZengNature PortfolioNature Communications2041-17232021-07-0112111210.1038/s41467-021-24762-wAll-inorganic perovskite quantum dot light-emitting memoriesMeng-Cheng Yen0Chia-Jung Lee1Kang-Hsiang Liu2Yi Peng3Junfu Leng4Tzu-Hsuan Chang5Chun-Chieh Chang6Kaoru Tamada7Ya-Ju Lee8Institute of Electro-Optical Engineering, National Taiwan Normal UniversityInstitute of Electro-Optical Engineering, National Taiwan Normal UniversityInstitute of Electro-Optical Engineering, National Taiwan Normal UniversityInstitute of Electro-Optical Engineering, National Taiwan Normal UniversityInstitute for Materials Chemistry and Engineering (IMCE), Kyushu UniversityGraduate Institute of Electronics Engineering, National Taiwan UniversityInstitute of Electro-Optical Engineering, National Taiwan Normal UniversityInstitute for Materials Chemistry and Engineering (IMCE), Kyushu UniversityInstitute of Electro-Optical Engineering, National Taiwan Normal UniversityElectric field induced ion migration is a well-known phenomenon in perovskite, but the consequences are notorious, and thus needs to be prevented. Here, on the other hand, the authors cleverly manipulate this event for realising resistive random-access memory and light-emitting electrochemical cell in one device based on CsPbBr3 quantum dots.https://doi.org/10.1038/s41467-021-24762-w
spellingShingle Meng-Cheng Yen
Chia-Jung Lee
Kang-Hsiang Liu
Yi Peng
Junfu Leng
Tzu-Hsuan Chang
Chun-Chieh Chang
Kaoru Tamada
Ya-Ju Lee
All-inorganic perovskite quantum dot light-emitting memories
Nature Communications
title All-inorganic perovskite quantum dot light-emitting memories
title_full All-inorganic perovskite quantum dot light-emitting memories
title_fullStr All-inorganic perovskite quantum dot light-emitting memories
title_full_unstemmed All-inorganic perovskite quantum dot light-emitting memories
title_short All-inorganic perovskite quantum dot light-emitting memories
title_sort all inorganic perovskite quantum dot light emitting memories
url https://doi.org/10.1038/s41467-021-24762-w
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