Device level assessment of Ni and Ni45Cu55 as electrodes in Mg2(Si,Sn)-based thermoelectric generators

Owing to efficient thermoelectric conversion, non-toxicity, low density and cost, Mg2(Si,Sn)-based solid solutions hold potential for mid-to-high temperature waste heat recovery. Yet, challenges arise from n-Mg2(Si,Sn) degradation at ≥400 °C caused by Mg loss and charge carrier reduction, particular...

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Main Authors: Radhika Deshpande, Julia Camut, Eckhard Müller, Johannes de Boor
Format: Article
Language:English
Published: Elsevier 2024-03-01
Series:Materials & Design
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S0264127524001291
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author Radhika Deshpande
Julia Camut
Eckhard Müller
Johannes de Boor
author_facet Radhika Deshpande
Julia Camut
Eckhard Müller
Johannes de Boor
author_sort Radhika Deshpande
collection DOAJ
description Owing to efficient thermoelectric conversion, non-toxicity, low density and cost, Mg2(Si,Sn)-based solid solutions hold potential for mid-to-high temperature waste heat recovery. Yet, challenges arise from n-Mg2(Si,Sn) degradation at ≥400 °C caused by Mg loss and charge carrier reduction, particularly in Sn-rich compositions. To build a thermoelectric generator (TEG) stable up to 400 °C, we propose binary Mg2Si as the n-type leg. Using Ni45Cu55 and Ni yields low electrical contact resistance (<5 µΩ.cm2) without altering the thermoelectric properties of n-Mg2Si. We fabricated two 2×2 leg TE modules with the same electrode/TE combination for the p-type legs and with Ni or Ni45Cu55 for their n-type legs and tested up to 400 °C, allowing for a direct comparison between these two electrodes for n-Mg2Si at the device level. Ni45Cu55 outperformed Ni, resulting in a peak power density of 0.79 W/cm2 at ΔT ∼375 K and an efficiency competitive to Mg2(Si,Sn)-only TEG. Comparative simulations using a constant property model revealed a strong reduction of internal losses when using Ni45Cu55 as the electrode for n-Mg2Si as the main reason for the high performance. The presented design overcame challenges such as Mg sublimation at targeted application temperature or electrode induced defect formation, resulting in a stable TEG.
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spelling doaj.art-f1478cb5ae4d49daad35df1e2c6f1fe22024-03-20T06:08:14ZengElsevierMaterials & Design0264-12752024-03-01239112757Device level assessment of Ni and Ni45Cu55 as electrodes in Mg2(Si,Sn)-based thermoelectric generatorsRadhika Deshpande0Julia Camut1Eckhard Müller2Johannes de Boor3Institute of Materials Research, German Aerospace Centre (DLR), Cologne, Germany; Corresponding authors.Institute of Materials Research, German Aerospace Centre (DLR), Cologne, GermanyInstitute of Materials Research, German Aerospace Centre (DLR), Cologne, Germany; Institute of Inorganic and Analytical Chemistry, Justus Liebig University of Giessen, Giessen, GermanyInstitute of Materials Research, German Aerospace Centre (DLR), Cologne, Germany; Institute of Technology for Nanostructures (NST) and CENIDE, Faculty of Engineering, University of Duisburg, Essen, Germany; Corresponding authors.Owing to efficient thermoelectric conversion, non-toxicity, low density and cost, Mg2(Si,Sn)-based solid solutions hold potential for mid-to-high temperature waste heat recovery. Yet, challenges arise from n-Mg2(Si,Sn) degradation at ≥400 °C caused by Mg loss and charge carrier reduction, particularly in Sn-rich compositions. To build a thermoelectric generator (TEG) stable up to 400 °C, we propose binary Mg2Si as the n-type leg. Using Ni45Cu55 and Ni yields low electrical contact resistance (<5 µΩ.cm2) without altering the thermoelectric properties of n-Mg2Si. We fabricated two 2×2 leg TE modules with the same electrode/TE combination for the p-type legs and with Ni or Ni45Cu55 for their n-type legs and tested up to 400 °C, allowing for a direct comparison between these two electrodes for n-Mg2Si at the device level. Ni45Cu55 outperformed Ni, resulting in a peak power density of 0.79 W/cm2 at ΔT ∼375 K and an efficiency competitive to Mg2(Si,Sn)-only TEG. Comparative simulations using a constant property model revealed a strong reduction of internal losses when using Ni45Cu55 as the electrode for n-Mg2Si as the main reason for the high performance. The presented design overcame challenges such as Mg sublimation at targeted application temperature or electrode induced defect formation, resulting in a stable TEG.http://www.sciencedirect.com/science/article/pii/S0264127524001291Mg2SiThermoelectricElectrodesDevice Modelling
spellingShingle Radhika Deshpande
Julia Camut
Eckhard Müller
Johannes de Boor
Device level assessment of Ni and Ni45Cu55 as electrodes in Mg2(Si,Sn)-based thermoelectric generators
Materials & Design
Mg2Si
Thermoelectric
Electrodes
Device Modelling
title Device level assessment of Ni and Ni45Cu55 as electrodes in Mg2(Si,Sn)-based thermoelectric generators
title_full Device level assessment of Ni and Ni45Cu55 as electrodes in Mg2(Si,Sn)-based thermoelectric generators
title_fullStr Device level assessment of Ni and Ni45Cu55 as electrodes in Mg2(Si,Sn)-based thermoelectric generators
title_full_unstemmed Device level assessment of Ni and Ni45Cu55 as electrodes in Mg2(Si,Sn)-based thermoelectric generators
title_short Device level assessment of Ni and Ni45Cu55 as electrodes in Mg2(Si,Sn)-based thermoelectric generators
title_sort device level assessment of ni and ni45cu55 as electrodes in mg2 si sn based thermoelectric generators
topic Mg2Si
Thermoelectric
Electrodes
Device Modelling
url http://www.sciencedirect.com/science/article/pii/S0264127524001291
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AT eckhardmuller devicelevelassessmentofniandni45cu55aselectrodesinmg2sisnbasedthermoelectricgenerators
AT johannesdeboor devicelevelassessmentofniandni45cu55aselectrodesinmg2sisnbasedthermoelectricgenerators