Measurement of nanopatterned surfaces by real and reciprocal space techniques
| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sciendo
2010-01-01
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| Series: | Measurement Science Review |
| Subjects: | |
| Online Access: | https://doi.org/10.2478/v10048-010-0027-1 |
| _version_ | 1818715950617198592 |
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| author | Siffalovic P. Vegso K. Jergel M. Majkova E. Keckes J. Maier G. Cornejo M. Ziberi B. Frost F. Hasse B. Wiesmann J. |
| author_facet | Siffalovic P. Vegso K. Jergel M. Majkova E. Keckes J. Maier G. Cornejo M. Ziberi B. Frost F. Hasse B. Wiesmann J. |
| author_sort | Siffalovic P. |
| collection | DOAJ |
| first_indexed | 2024-12-17T19:11:30Z |
| format | Article |
| id | doaj.art-f1cf84f8b46b4f32a6f92d90feae68a4 |
| institution | Directory Open Access Journal |
| issn | 1335-8871 |
| language | English |
| last_indexed | 2024-12-17T19:11:30Z |
| publishDate | 2010-01-01 |
| publisher | Sciendo |
| record_format | Article |
| series | Measurement Science Review |
| spelling | doaj.art-f1cf84f8b46b4f32a6f92d90feae68a42022-12-21T21:35:51ZengSciendoMeasurement Science Review1335-88712010-01-0110515315610.2478/v10048-010-0027-1Measurement of nanopatterned surfaces by real and reciprocal space techniquesSiffalovic P.0Vegso K.1Jergel M.2Majkova E.3Keckes J.4Maier G.5Cornejo M.6Ziberi B.7Frost F.8Hasse B.9Wiesmann J.10Institute of Physics SAS, Dubravska cesta 9, 84511 Bratislava, SlovakiaInstitute of Physics SAS, Dubravska cesta 9, 84511 Bratislava, SlovakiaInstitute of Physics SAS, Dubravska cesta 9, 84511 Bratislava, SlovakiaInstitute of Physics SAS, Dubravska cesta 9, 84511 Bratislava, SlovakiaErich Schmid Institute for Materials Science, Jahnstr. 12, A-8700 Leoben, AustriaMaterials Center Leoben Forschung GmbH, Roseggerstr. 12, A-8700 Leoben, AustriaLeibniz-Institut für Oberflächenmodifizierung e. V., 04318 Leipzig, GermanyLeibniz-Institut für Oberflächenmodifizierung e. V., 04318 Leipzig, GermanyLeibniz-Institut für Oberflächenmodifizierung e. V., 04318 Leipzig, GermanyIncoatec GmbH, Max-Planck-Str. 2, 21502 Geesthacht, GermanyIncoatec GmbH, Max-Planck-Str. 2, 21502 Geesthacht, Germanyhttps://doi.org/10.2478/v10048-010-0027-1afmgisaxsnanostructuresion-beam sputtering |
| spellingShingle | Siffalovic P. Vegso K. Jergel M. Majkova E. Keckes J. Maier G. Cornejo M. Ziberi B. Frost F. Hasse B. Wiesmann J. Measurement of nanopatterned surfaces by real and reciprocal space techniques Measurement Science Review afm gisaxs nanostructures ion-beam sputtering |
| title | Measurement of nanopatterned surfaces by real and reciprocal space techniques |
| title_full | Measurement of nanopatterned surfaces by real and reciprocal space techniques |
| title_fullStr | Measurement of nanopatterned surfaces by real and reciprocal space techniques |
| title_full_unstemmed | Measurement of nanopatterned surfaces by real and reciprocal space techniques |
| title_short | Measurement of nanopatterned surfaces by real and reciprocal space techniques |
| title_sort | measurement of nanopatterned surfaces by real and reciprocal space techniques |
| topic | afm gisaxs nanostructures ion-beam sputtering |
| url | https://doi.org/10.2478/v10048-010-0027-1 |
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