Indexing of Laue Back Reflection for Quartz Crystal and Singularity Evaluation of Zn Metal Thin Film
Laue back reflection patterns for quartz crystal are indexed by using Orient Express- program to simulate orientation of single crystals from assignment of principle zones. An oriented quartz single crystal was used as a substrate to deposit Zn metal by controlled thermal evaporation to achieve sin...
Main Author: | Jinan Mohammad Hasan Jabir |
---|---|
Format: | Article |
Language: | English |
Published: |
University of Baghdad
2010-10-01
|
Series: | Iraqi Journal of Physics |
Subjects: | |
Online Access: | https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/867 |
Similar Items
-
CNN-Based Laue Spot Morphology Predictor for Reliable Crystallographic Descriptor Estimation
by: Tom Kirstein, et al.
Published: (2023-04-01) -
In‐situ force measurement during nano‐indentation combined with Laue microdiffraction
by: Florian Lauraux, et al.
Published: (2021-01-01) -
Mapping nanocrystal orientations via scanning Laue diffraction microscopy for multi-peak Bragg coherent diffraction imaging
by: Yueheng Zhang, et al.
Published: (2023-07-01) -
Pyroelectrically caused twisting of quartz crystals
by: Mirjan Žorž
Published: (1994-12-01) -
Some new aspects of the characterization of Miller, Laue and directions indices for centred lattices
by: Edward Michalski
Published: (2022-10-01)