Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode Matching
In recent times, due to the high operating frequency and low operating voltage of modern electronic devices, intended electromagnetic interference (IEMI) has been the cause of increasing damage. In particular, targets with precision electronics such as aircrafts or missiles have shown that a high-po...
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MDPI AG
2023-03-01
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Online Access: | https://www.mdpi.com/1424-8220/23/6/3278 |
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author | Wonjune Kang No-Weon Kang Woosang Lee Changyul Cheon Young-Seek Chung |
author_facet | Wonjune Kang No-Weon Kang Woosang Lee Changyul Cheon Young-Seek Chung |
author_sort | Wonjune Kang |
collection | DOAJ |
description | In recent times, due to the high operating frequency and low operating voltage of modern electronic devices, intended electromagnetic interference (IEMI) has been the cause of increasing damage. In particular, targets with precision electronics such as aircrafts or missiles have shown that a high-power microwave (HPM) may cause malfunction or partial destruction of the GPS or the avionic control system. Analysis of the effects of IEMI requires electromagnetic numerical analyses. However, there are limitations to conventional numerical techniques, such as the finite element method, method of moment, or finite difference time domain method, due to the complexity and large electrical length of a real target system. In this paper, we proposed a new cylindrical mode matching (CMM) technique to analyze IEMI of the generic missile (GENEC) model, which is a hollow metal cylinder with multiple apertures. Using the CMM, we can quickly analyze the effect of the IEMI inside the GENEC model from 1.7 to 2.5 GHz. The results were compared with those of the measurements and, for verification, with the FEKO, a commercial software program developed by Altair Engineering, and showed good agreement. In this paper, the electro-optic (EO) probe was used to measure the electric field inside the GENEC model. |
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language | English |
last_indexed | 2024-03-11T05:55:50Z |
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spelling | doaj.art-f1eec51f0fba4f8cb8dae9d38271f1e62023-11-17T13:48:36ZengMDPI AGSensors1424-82202023-03-01236327810.3390/s23063278Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode MatchingWonjune Kang0No-Weon Kang1Woosang Lee2Changyul Cheon3Young-Seek Chung4Department of Electronics Convergence Engineering, Kwangwoon University, Seoul 01897, Republic of KoreaDivision of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon 34113, Republic of KoreaAgency for Defense Development, Daejeon 34186, Republic of KoreaSchool of Electrical and Computer Engineering, University of Seoul, Seoul 02504, Republic of KoreaDepartment of Electronics Convergence Engineering, Kwangwoon University, Seoul 01897, Republic of KoreaIn recent times, due to the high operating frequency and low operating voltage of modern electronic devices, intended electromagnetic interference (IEMI) has been the cause of increasing damage. In particular, targets with precision electronics such as aircrafts or missiles have shown that a high-power microwave (HPM) may cause malfunction or partial destruction of the GPS or the avionic control system. Analysis of the effects of IEMI requires electromagnetic numerical analyses. However, there are limitations to conventional numerical techniques, such as the finite element method, method of moment, or finite difference time domain method, due to the complexity and large electrical length of a real target system. In this paper, we proposed a new cylindrical mode matching (CMM) technique to analyze IEMI of the generic missile (GENEC) model, which is a hollow metal cylinder with multiple apertures. Using the CMM, we can quickly analyze the effect of the IEMI inside the GENEC model from 1.7 to 2.5 GHz. The results were compared with those of the measurements and, for verification, with the FEKO, a commercial software program developed by Altair Engineering, and showed good agreement. In this paper, the electro-optic (EO) probe was used to measure the electric field inside the GENEC model.https://www.mdpi.com/1424-8220/23/6/3278cylindrical mode matchingelectromagnetic interferenceelectromagnetic topologygeneric missile model |
spellingShingle | Wonjune Kang No-Weon Kang Woosang Lee Changyul Cheon Young-Seek Chung Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode Matching Sensors cylindrical mode matching electromagnetic interference electromagnetic topology generic missile model |
title | Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode Matching |
title_full | Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode Matching |
title_fullStr | Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode Matching |
title_full_unstemmed | Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode Matching |
title_short | Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode Matching |
title_sort | analysis of intentional electromagnetic interference on genec model using cylindrical mode matching |
topic | cylindrical mode matching electromagnetic interference electromagnetic topology generic missile model |
url | https://www.mdpi.com/1424-8220/23/6/3278 |
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