Open-Circuit Fault-Tolerant Method for Half-Bridge Switches of Three-Level Quasi-Switched Boost T-Type Inverter to Improve Voltage Gain
The three-level quasi-switched boost T-type inverter (3L-qSBT2I) can feature buck-boost operating and shoot-through (ST) immunity with high voltage gain and low component voltage rating. In order to improve the reliability of 3L-qSBT2I, this paper proposes an open-circuit fault-tolerant (OC-FT) meth...
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IEEE
2024-01-01
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Online Access: | https://ieeexplore.ieee.org/document/10410635/ |
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author | Duc-Tri Do Khai M. Nguyen Vinh-Thanh Tran |
author_facet | Duc-Tri Do Khai M. Nguyen Vinh-Thanh Tran |
author_sort | Duc-Tri Do |
collection | DOAJ |
description | The three-level quasi-switched boost T-type inverter (3L-qSBT2I) can feature buck-boost operating and shoot-through (ST) immunity with high voltage gain and low component voltage rating. In order to improve the reliability of 3L-qSBT2I, this paper proposes an open-circuit fault-tolerant (OC-FT) method to solve OC faults of semiconductor devices. Under this approach, OC faults of half-bridge switches of the T2I branch are addressed. To solve these faults, one extra normally-closed (NC) relay is integrated with the 3L-qSBT2I, which connects neutral points of DC-link voltage and inverter side. In normal condition, this relay is closed and the inverter operates like a conventional 3L-qSBT2I. In post-fault operation, this relay is opened and the inverter operates like a two-level inverter. A new two-level space vector modulation (SVM) scheme is introduced to control this inverter. Unlike any traditional OC-FT methods, in this proposed method, almost large voltage vectors are still used, in post-fault operating. Therefore, the voltage gain of the proposed method is increased compared to others. Comparison study and experimental results are presented to validate the proposed topology and FT method. |
first_indexed | 2024-03-08T08:39:52Z |
format | Article |
id | doaj.art-f30a271903494502a51a4ff41e6ac8e2 |
institution | Directory Open Access Journal |
issn | 2169-3536 |
language | English |
last_indexed | 2024-03-08T08:39:52Z |
publishDate | 2024-01-01 |
publisher | IEEE |
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series | IEEE Access |
spelling | doaj.art-f30a271903494502a51a4ff41e6ac8e22024-02-02T00:03:56ZengIEEEIEEE Access2169-35362024-01-0112155351554810.1109/ACCESS.2024.335655910410635Open-Circuit Fault-Tolerant Method for Half-Bridge Switches of Three-Level Quasi-Switched Boost T-Type Inverter to Improve Voltage GainDuc-Tri Do0https://orcid.org/0000-0002-4096-5208Khai M. Nguyen1https://orcid.org/0000-0003-1774-0817Vinh-Thanh Tran2https://orcid.org/0000-0001-7135-5077Faculty of Electrical and Electronics Engineering, Ho Chi Minh City University of Technology and Education, Ho Chi Minh City, VietnamFaculty of Electrical and Electronics Engineering, Ho Chi Minh City University of Technology and Education, Ho Chi Minh City, VietnamFaculty of Electrical and Electronics Engineering, Ho Chi Minh City University of Technology and Education, Ho Chi Minh City, VietnamThe three-level quasi-switched boost T-type inverter (3L-qSBT2I) can feature buck-boost operating and shoot-through (ST) immunity with high voltage gain and low component voltage rating. In order to improve the reliability of 3L-qSBT2I, this paper proposes an open-circuit fault-tolerant (OC-FT) method to solve OC faults of semiconductor devices. Under this approach, OC faults of half-bridge switches of the T2I branch are addressed. To solve these faults, one extra normally-closed (NC) relay is integrated with the 3L-qSBT2I, which connects neutral points of DC-link voltage and inverter side. In normal condition, this relay is closed and the inverter operates like a conventional 3L-qSBT2I. In post-fault operation, this relay is opened and the inverter operates like a two-level inverter. A new two-level space vector modulation (SVM) scheme is introduced to control this inverter. Unlike any traditional OC-FT methods, in this proposed method, almost large voltage vectors are still used, in post-fault operating. Therefore, the voltage gain of the proposed method is increased compared to others. Comparison study and experimental results are presented to validate the proposed topology and FT method.https://ieeexplore.ieee.org/document/10410635/T-type inverterquasi-switched boostfault-tolerantthree-level inverteropen-circuit fault |
spellingShingle | Duc-Tri Do Khai M. Nguyen Vinh-Thanh Tran Open-Circuit Fault-Tolerant Method for Half-Bridge Switches of Three-Level Quasi-Switched Boost T-Type Inverter to Improve Voltage Gain IEEE Access T-type inverter quasi-switched boost fault-tolerant three-level inverter open-circuit fault |
title | Open-Circuit Fault-Tolerant Method for Half-Bridge Switches of Three-Level Quasi-Switched Boost T-Type Inverter to Improve Voltage Gain |
title_full | Open-Circuit Fault-Tolerant Method for Half-Bridge Switches of Three-Level Quasi-Switched Boost T-Type Inverter to Improve Voltage Gain |
title_fullStr | Open-Circuit Fault-Tolerant Method for Half-Bridge Switches of Three-Level Quasi-Switched Boost T-Type Inverter to Improve Voltage Gain |
title_full_unstemmed | Open-Circuit Fault-Tolerant Method for Half-Bridge Switches of Three-Level Quasi-Switched Boost T-Type Inverter to Improve Voltage Gain |
title_short | Open-Circuit Fault-Tolerant Method for Half-Bridge Switches of Three-Level Quasi-Switched Boost T-Type Inverter to Improve Voltage Gain |
title_sort | open circuit fault tolerant method for half bridge switches of three level quasi switched boost t type inverter to improve voltage gain |
topic | T-type inverter quasi-switched boost fault-tolerant three-level inverter open-circuit fault |
url | https://ieeexplore.ieee.org/document/10410635/ |
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