Theoretical Studies on InGaAs/InAlAs SAGCM Avalanche Photodiodes

Abstract In this paper, we provide a detailed insight on InGaAs/InAlAs separate absorption, grading, charge, and multiplication avalanche photodiodes (SAGCM APDs) and a theoretical model of APDs is built. Through theoretical analysis and two-dimensional (2D) simulation, the influence of charge layer...

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Main Authors: Siyu Cao, Yue Zhao, Sajid ur Rehman, Shuai Feng, Yuhua Zuo, Chuanbo Li, Lichun Zhang, Buwen Cheng, Qiming Wang
Format: Article
Language:English
Published: SpringerOpen 2018-05-01
Series:Nanoscale Research Letters
Subjects:
Online Access:http://link.springer.com/article/10.1186/s11671-018-2559-5
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author Siyu Cao
Yue Zhao
Sajid ur Rehman
Shuai Feng
Yuhua Zuo
Chuanbo Li
Lichun Zhang
Buwen Cheng
Qiming Wang
author_facet Siyu Cao
Yue Zhao
Sajid ur Rehman
Shuai Feng
Yuhua Zuo
Chuanbo Li
Lichun Zhang
Buwen Cheng
Qiming Wang
author_sort Siyu Cao
collection DOAJ
description Abstract In this paper, we provide a detailed insight on InGaAs/InAlAs separate absorption, grading, charge, and multiplication avalanche photodiodes (SAGCM APDs) and a theoretical model of APDs is built. Through theoretical analysis and two-dimensional (2D) simulation, the influence of charge layer and tunneling effect on the APDs is fully understood. The design of charge layer (including doping level and thickness) can be calculated by our predictive model for different multiplication thickness. We find that as the thickness of charge layer increases, the suitable doping level range in charge layer decreases. Compared to thinner charge layer, performance of APD varies significantly via several percent deviations of doping concentrations in thicker charge layer. Moreover, the generation rate (G btt ) of band-to-band tunnel is calculated, and the influence of tunneling effect on avalanche field was analyzed. We confirm that avalanche field and multiplication factor (M n ) in multiplication will decrease by the tunneling effect. The theoretical model and analysis are based on InGaAs/InAlAs APD; however, they are applicable to other APD material systems as well.
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spelling doaj.art-f358fcd11a3f47518440d40bad2e81902023-09-02T18:36:37ZengSpringerOpenNanoscale Research Letters1931-75731556-276X2018-05-0113111510.1186/s11671-018-2559-5Theoretical Studies on InGaAs/InAlAs SAGCM Avalanche PhotodiodesSiyu Cao0Yue Zhao1Sajid ur Rehman2Shuai Feng3Yuhua Zuo4Chuanbo Li5Lichun Zhang6Buwen Cheng7Qiming Wang8State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of SciencesState Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of SciencesState Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of SciencesSchool of Science, Minzu University of ChinaState Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of SciencesSchool of Science, Minzu University of ChinaSchool of Physics and Optoelectronic Engineering, Ludong UniversityState Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of SciencesState Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of SciencesAbstract In this paper, we provide a detailed insight on InGaAs/InAlAs separate absorption, grading, charge, and multiplication avalanche photodiodes (SAGCM APDs) and a theoretical model of APDs is built. Through theoretical analysis and two-dimensional (2D) simulation, the influence of charge layer and tunneling effect on the APDs is fully understood. The design of charge layer (including doping level and thickness) can be calculated by our predictive model for different multiplication thickness. We find that as the thickness of charge layer increases, the suitable doping level range in charge layer decreases. Compared to thinner charge layer, performance of APD varies significantly via several percent deviations of doping concentrations in thicker charge layer. Moreover, the generation rate (G btt ) of band-to-band tunnel is calculated, and the influence of tunneling effect on avalanche field was analyzed. We confirm that avalanche field and multiplication factor (M n ) in multiplication will decrease by the tunneling effect. The theoretical model and analysis are based on InGaAs/InAlAs APD; however, they are applicable to other APD material systems as well.http://link.springer.com/article/10.1186/s11671-018-2559-5Avalanche photodiodesTheoretical analysisSimulationCharge layerTunneling effect
spellingShingle Siyu Cao
Yue Zhao
Sajid ur Rehman
Shuai Feng
Yuhua Zuo
Chuanbo Li
Lichun Zhang
Buwen Cheng
Qiming Wang
Theoretical Studies on InGaAs/InAlAs SAGCM Avalanche Photodiodes
Nanoscale Research Letters
Avalanche photodiodes
Theoretical analysis
Simulation
Charge layer
Tunneling effect
title Theoretical Studies on InGaAs/InAlAs SAGCM Avalanche Photodiodes
title_full Theoretical Studies on InGaAs/InAlAs SAGCM Avalanche Photodiodes
title_fullStr Theoretical Studies on InGaAs/InAlAs SAGCM Avalanche Photodiodes
title_full_unstemmed Theoretical Studies on InGaAs/InAlAs SAGCM Avalanche Photodiodes
title_short Theoretical Studies on InGaAs/InAlAs SAGCM Avalanche Photodiodes
title_sort theoretical studies on ingaas inalas sagcm avalanche photodiodes
topic Avalanche photodiodes
Theoretical analysis
Simulation
Charge layer
Tunneling effect
url http://link.springer.com/article/10.1186/s11671-018-2559-5
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