http://www.tkea.com.ua/tkea/2008/6_2008/pdf/12.zip

http://www.tkea.com.ua/tkea/2008/6_2008/pdf/12.zip

It is established radiation-induced decreasing in fragility of structural network takes place for γ-irradiated sample of Ge15,8As21S63,2 chalcogenide glass. It is concluded on the basis of the results obtained that radiation modification of chalcogenide glass leads to the rigidity of its matrix, and...

Täydet tiedot

Bibliografiset tiedot
Päätekijät: Kavetskyy T. S., Shpotyuk O. I., Litovchenko P. G., Tsmots V. M.
Aineistotyyppi: Artikkeli
Kieli:English
Julkaistu: Politehperiodika 2008-12-01
Sarja:Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
Aiheet:
chalcogenide glass
Raman spectroscopy
boson peak
structural grid fragility
radiation modification
γ-irradiation
Linkit:http://www.tkea.com.ua/tkea/2008/6_2008/pdf/13.zip

Internet

http://www.tkea.com.ua/tkea/2008/6_2008/pdf/13.zip

Samankaltaisia teoksia