Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors
An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the ‘water window’ spectral range (λ= 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Sil...
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Sciendo
2016-06-01
|
| Series: | Nukleonika |
| Subjects: | |
| Online Access: | http://www.degruyter.com/view/j/nuka.2016.61.issue-2/nuka-2016-0024/nuka-2016-0024.xml?format=INT |
| Summary: | An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the ‘water window’ spectral range (λ= 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Silicon Carbide (SiC) detector was used to characterize the nitrogen plasma emission in terms of gas-puff target parameters. The measurements show applicability of SiC detectors for SXR plasma characterization. |
|---|---|
| ISSN: | 0029-5922 |