Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors

Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors

An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the ‘water window’ spectral range (λ= 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Sil...

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Bibliographic Details
Main Authors: Torrisi Alfio, Wachulak Przemysław, Torrisi Lorenzo, Bartnik Andrzej, Węgrzyński Łukasz, Fiedorowicz Henryk
Format: Article
Language:English
Published: Sciendo 2016-06-01
Series:Nukleonika
Subjects:
gas-puff target
plasma diagnostic technique
SiC detector
‘water-window’
EUV
Online Access:http://www.degruyter.com/view/j/nuka.2016.61.issue-2/nuka-2016-0024/nuka-2016-0024.xml?format=INT

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