ON RESOLUTION OF ELECTRON IMAGES OF DEVISED DEVICES COVERED WITH NANOTECHNOLOGICAL FILMS
The possibility for optical resolution of electron-optic transformers by means of selection of initial energy of electrons within the film of thicknesses 46÷282 nm has been shown
| Main Authors: | , , |
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| Format: | Article |
| Language: | Russian |
| Published: |
Tver State University
2011-12-01
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| Series: | Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов |
| Subjects: | |
| Online Access: | http://physchemaspects.ru/archives/2011/%D0%A4%D0%A5-2011%20%D0%90%D1%87%D0%B5%D0%B5%D0%B2%D0%B0%20%D0%AD%D0%90.pdf |
| _version_ | 1818036332594724864 |
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| author | E.A. Acheeva V.N. Grinyuk V.A. Sozaev |
| author_facet | E.A. Acheeva V.N. Grinyuk V.A. Sozaev |
| author_sort | E.A. Acheeva |
| collection | DOAJ |
| description | The possibility for optical resolution of electron-optic transformers by means of selection of initial energy of electrons within the film of thicknesses 46÷282 nm has been shown |
| first_indexed | 2024-12-10T07:09:16Z |
| format | Article |
| id | doaj.art-f4f069b189f64f7c82a42d805c5864f1 |
| institution | Directory Open Access Journal |
| issn | 2226-4442 2658-4360 |
| language | Russian |
| last_indexed | 2024-12-10T07:09:16Z |
| publishDate | 2011-12-01 |
| publisher | Tver State University |
| record_format | Article |
| series | Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов |
| spelling | doaj.art-f4f069b189f64f7c82a42d805c5864f12022-12-22T01:58:07ZrusTver State UniversityФизико-химические аспекты изучения кластеров, наноструктур и наноматериалов2226-44422658-43602011-12-0131315ON RESOLUTION OF ELECTRON IMAGES OF DEVISED DEVICES COVERED WITH NANOTECHNOLOGICAL FILMSE.A. Acheeva0V.N. Grinyuk1 V.A. Sozaev2North Caucasian Institute of Mining and MetallurgyNorth Caucasian Institute of Mining and MetallurgyNorth Caucasian Institute of Mining and MetallurgyThe possibility for optical resolution of electron-optic transformers by means of selection of initial energy of electrons within the film of thicknesses 46÷282 nm has been shownhttp://physchemaspects.ru/archives/2011/%D0%A4%D0%A5-2011%20%D0%90%D1%87%D0%B5%D0%B5%D0%B2%D0%B0%20%D0%AD%D0%90.pdfnanotech filmselectron-optical converterthe blur parameter of the electron energy |
| spellingShingle | E.A. Acheeva V.N. Grinyuk V.A. Sozaev ON RESOLUTION OF ELECTRON IMAGES OF DEVISED DEVICES COVERED WITH NANOTECHNOLOGICAL FILMS Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов nanotech films electron-optical converter the blur parameter of the electron energy |
| title | ON RESOLUTION OF ELECTRON IMAGES OF DEVISED DEVICES COVERED WITH NANOTECHNOLOGICAL FILMS |
| title_full | ON RESOLUTION OF ELECTRON IMAGES OF DEVISED DEVICES COVERED WITH NANOTECHNOLOGICAL FILMS |
| title_fullStr | ON RESOLUTION OF ELECTRON IMAGES OF DEVISED DEVICES COVERED WITH NANOTECHNOLOGICAL FILMS |
| title_full_unstemmed | ON RESOLUTION OF ELECTRON IMAGES OF DEVISED DEVICES COVERED WITH NANOTECHNOLOGICAL FILMS |
| title_short | ON RESOLUTION OF ELECTRON IMAGES OF DEVISED DEVICES COVERED WITH NANOTECHNOLOGICAL FILMS |
| title_sort | on resolution of electron images of devised devices covered with nanotechnological films |
| topic | nanotech films electron-optical converter the blur parameter of the electron energy |
| url | http://physchemaspects.ru/archives/2011/%D0%A4%D0%A5-2011%20%D0%90%D1%87%D0%B5%D0%B5%D0%B2%D0%B0%20%D0%AD%D0%90.pdf |
| work_keys_str_mv | AT eaacheeva onresolutionofelectronimagesofdeviseddevicescoveredwithnanotechnologicalfilms AT vngrinyuk onresolutionofelectronimagesofdeviseddevicescoveredwithnanotechnologicalfilms AT vasozaev onresolutionofelectronimagesofdeviseddevicescoveredwithnanotechnologicalfilms |