Application of Proton Irradiation in the Study of Accelerated Radiation Ageing in a GaAs Semiconductor

Proton irradiation experiments have been used as a surrogate for studying radiation effects in numerous materials for decades. The abundance and accessibility of proton accelerators make this approach convenient for conducting accelerated radiation ageing studies. However, developing new materials w...

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Main Authors: Igor Neuhold, Pavol Noga, Stanislav Sojak, Martin Petriska, Jarmila Degmova, Vladimir Slugen, Vladimir Krsjak
Format: Article
Language:English
Published: MDPI AG 2023-01-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/16/3/1089
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author Igor Neuhold
Pavol Noga
Stanislav Sojak
Martin Petriska
Jarmila Degmova
Vladimir Slugen
Vladimir Krsjak
author_facet Igor Neuhold
Pavol Noga
Stanislav Sojak
Martin Petriska
Jarmila Degmova
Vladimir Slugen
Vladimir Krsjak
author_sort Igor Neuhold
collection DOAJ
description Proton irradiation experiments have been used as a surrogate for studying radiation effects in numerous materials for decades. The abundance and accessibility of proton accelerators make this approach convenient for conducting accelerated radiation ageing studies. However, developing new materials with improved radiation stability requires numerous model materials, test samples, and very effective utilization of the accelerator beam time. Therefore, the question of optimal beam current, or particle flux, is critical and needs to be adequately understood. In this work, we used 5 MeV protons to introduce displacement damage in gallium arsenide samples using a wide range of flux values. Positron annihilation lifetime spectroscopy was used to quantitatively assess the concentration of radiation-induced survived vacancies. The results show that proton fluxes in range between 10<sup>11</sup> and 10<sup>12</sup> cm<sup>−2</sup>.s<sup>−1</sup> lead to a similar concentration of monovacancies generated in the GaAs semiconductor material, while a further increase in the flux leads to a sharp drop in this concentration.
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spelling doaj.art-f55207af9c6d4e7b9c57165c743d6ed72023-11-16T17:16:59ZengMDPI AGMaterials1996-19442023-01-01163108910.3390/ma16031089Application of Proton Irradiation in the Study of Accelerated Radiation Ageing in a GaAs SemiconductorIgor Neuhold0Pavol Noga1Stanislav Sojak2Martin Petriska3Jarmila Degmova4Vladimir Slugen5Vladimir Krsjak6Institute of Nuclear and Physical Engineering, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology in Bratislava, Ilkovicova 3, 81219 Bratislava, SlovakiaAdvanced Technologies Research Institute, Faculty of Materials Science and Technology, Slovak University of Technology in Bratislava, Jana Bottu 25, 91724 Trnava, SlovakiaInstitute of Nuclear and Physical Engineering, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology in Bratislava, Ilkovicova 3, 81219 Bratislava, SlovakiaInstitute of Nuclear and Physical Engineering, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology in Bratislava, Ilkovicova 3, 81219 Bratislava, SlovakiaInstitute of Nuclear and Physical Engineering, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology in Bratislava, Ilkovicova 3, 81219 Bratislava, SlovakiaInstitute of Nuclear and Physical Engineering, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology in Bratislava, Ilkovicova 3, 81219 Bratislava, SlovakiaInstitute of Nuclear and Physical Engineering, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology in Bratislava, Ilkovicova 3, 81219 Bratislava, SlovakiaProton irradiation experiments have been used as a surrogate for studying radiation effects in numerous materials for decades. The abundance and accessibility of proton accelerators make this approach convenient for conducting accelerated radiation ageing studies. However, developing new materials with improved radiation stability requires numerous model materials, test samples, and very effective utilization of the accelerator beam time. Therefore, the question of optimal beam current, or particle flux, is critical and needs to be adequately understood. In this work, we used 5 MeV protons to introduce displacement damage in gallium arsenide samples using a wide range of flux values. Positron annihilation lifetime spectroscopy was used to quantitatively assess the concentration of radiation-induced survived vacancies. The results show that proton fluxes in range between 10<sup>11</sup> and 10<sup>12</sup> cm<sup>−2</sup>.s<sup>−1</sup> lead to a similar concentration of monovacancies generated in the GaAs semiconductor material, while a further increase in the flux leads to a sharp drop in this concentration.https://www.mdpi.com/1996-1944/16/3/1089semiconductorsWBGproton irradiationageinggallium arsenidepositron annihilation spectroscopy
spellingShingle Igor Neuhold
Pavol Noga
Stanislav Sojak
Martin Petriska
Jarmila Degmova
Vladimir Slugen
Vladimir Krsjak
Application of Proton Irradiation in the Study of Accelerated Radiation Ageing in a GaAs Semiconductor
Materials
semiconductors
WBG
proton irradiation
ageing
gallium arsenide
positron annihilation spectroscopy
title Application of Proton Irradiation in the Study of Accelerated Radiation Ageing in a GaAs Semiconductor
title_full Application of Proton Irradiation in the Study of Accelerated Radiation Ageing in a GaAs Semiconductor
title_fullStr Application of Proton Irradiation in the Study of Accelerated Radiation Ageing in a GaAs Semiconductor
title_full_unstemmed Application of Proton Irradiation in the Study of Accelerated Radiation Ageing in a GaAs Semiconductor
title_short Application of Proton Irradiation in the Study of Accelerated Radiation Ageing in a GaAs Semiconductor
title_sort application of proton irradiation in the study of accelerated radiation ageing in a gaas semiconductor
topic semiconductors
WBG
proton irradiation
ageing
gallium arsenide
positron annihilation spectroscopy
url https://www.mdpi.com/1996-1944/16/3/1089
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