Integrated X-ray fluorescence and diffuse visible-to-near-infrared reflectance scanner for standoff elemental and molecular spectroscopic imaging of paints and works on paper

Integrated X-ray fluorescence and diffuse visible-to-near-infrared reflectance scanner for standoff elemental and molecular spectroscopic imaging of paints and works on paper

Abstract Prior studies have shown the improved ability to identify artists’ pigments by combining results from X-ray fluorescence (XRF), which provides elemental information, with reflectance spectroscopy in the visible to near infrared (400–1000 nm) that provides information on electronic transitio...

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Bibliographic Details
Main Authors: John K. Delaney, Damon M. Conover, Kathryn A. Dooley, Lisha Glinsman, Koen Janssens, Murray Loew
Format: Article
Language:English
Published: SpringerOpen 2018-05-01
Series:Heritage Science
Subjects:
Reflectance imaging spectroscopy
MA-XRF
X-ray fluorescence
FORS
Pigment mapping
Online Access:http://link.springer.com/article/10.1186/s40494-018-0197-y

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