Types and frequency of whole slide imaging scan failures in a clinical high throughput digital pathology scanning laboratory

Types and frequency of whole slide imaging scan failures in a clinical high throughput digital pathology scanning laboratory

Digital workflow transformation continues to sweep throughout a diversity of pathology departments spanning the globe following catalyzation of whole slide imaging (WSI) adoption by the SARS-CoV-2 (COVID-19) pandemic. The utility of WSI for a litany of use cases including primary diagnosis has been...

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Bibliographic Details
Main Authors: Ankush U. Patel, Nada Shaker, Savannah Erck, David A. Kellough, Erin Palermini, Zaibo Li, Giovanni Lujan, Swati Satturwar, Anil V. Parwani
Format: Article
Language:English
Published: Elsevier 2022-01-01
Series:Journal of Pathology Informatics
Subjects:
Whole slide imaging (WSI)
Digital pathology (DP)
Laboratory workflow
WSI scan failure types
WSI scan frequency
WSI turnaround time (TAT)
Online Access:http://www.sciencedirect.com/science/article/pii/S2153353922007064

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