Measurements of Stray Magnetic Fields of Fe-Rich Amorphous Microwires Using a Scanning GMI Magnetometer

A scanning magnetometer based on a magnetoimpedance sensor with a 1 mm spatial resolution and 10 nT sensitivity was used to study stray magnetic fields of Fe<sub>74</sub>B<sub>13</sub>Si<sub>11</sub>C<sub>2</sub> amorphous ferromagnetic microwires. Spa...

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Bibliographic Details
Main Authors: Georgy Danilov, Yury Grebenshchikov, Vladimir Odintsov, Margarita Churyukanova, Sergey Gudoshnikov
Format: Article
Language:English
Published: MDPI AG 2023-04-01
Series:Metals
Subjects:
Online Access:https://www.mdpi.com/2075-4701/13/4/800
Description
Summary:A scanning magnetometer based on a magnetoimpedance sensor with a 1 mm spatial resolution and 10 nT sensitivity was used to study stray magnetic fields of Fe<sub>74</sub>B<sub>13</sub>Si<sub>11</sub>C<sub>2</sub> amorphous ferromagnetic microwires. Spatial magnetic images and vertical component profiles of stray magnetic fields of the studied microwires were obtained in a longitudinal homogeneous magnetic field of Helmholtz coils with a strength in the range of ±600 A/m. A magnetic calculation method is suggested that allows for using the measured magnetic fields to determine the magnitude and pattern of magnetization for the microwire. Characteristic values of the microwires’ average magnetization and width of closure domains for various values of bias fields were found.
ISSN:2075-4701