Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media

Abstract X-ray computed micro-tomography typically involves a trade-off between sample size and resolution, complicating the study at a micrometer scale of representative volumes of materials with broad feature size distributions (e.g. natural stones). X-ray dark-field tomography exploits scattering...

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Main Authors: Benjamin K. Blykers, Caori Organista, Matthieu N. Boone, Matias Kagias, Federica Marone, Marco Stampanoni, Tom Bultreys, Veerle Cnudde, Jan Aelterman
Format: Article
Language:English
Published: Nature Portfolio 2021-09-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-021-97915-y
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author Benjamin K. Blykers
Caori Organista
Matthieu N. Boone
Matias Kagias
Federica Marone
Marco Stampanoni
Tom Bultreys
Veerle Cnudde
Jan Aelterman
author_facet Benjamin K. Blykers
Caori Organista
Matthieu N. Boone
Matias Kagias
Federica Marone
Marco Stampanoni
Tom Bultreys
Veerle Cnudde
Jan Aelterman
author_sort Benjamin K. Blykers
collection DOAJ
description Abstract X-ray computed micro-tomography typically involves a trade-off between sample size and resolution, complicating the study at a micrometer scale of representative volumes of materials with broad feature size distributions (e.g. natural stones). X-ray dark-field tomography exploits scattering to probe sub-resolution features, promising to overcome this trade-off. In this work, we present a quantification method for sub-resolution feature sizes using dark-field tomograms obtained by tuning the autocorrelation length of a Talbot grating interferometer. Alumina particles with different nominal pore sizes (50 nm and 150 nm) were mixed and imaged at the TOMCAT beamline of the SLS synchrotron (PSI) at eighteen correlation lengths, covering the pore size range. The different particles cannot be distinguished by traditional absorption µCT due to their very similar density and the pores being unresolved at typical image resolutions. Nevertheless, by exploiting the scattering behavior of the samples, the proposed analysis method allowed to quantify the nominal pore sizes of individual particles. The robustness of this quantification was proven by reproducing the experiment with solid samples of alumina, and alumina particles that were kept separated. Our findings demonstrate the possibility to calibrate dark-field image analysis to quantify sub-resolution feature sizes, allowing multi-scale analyses of heterogeneous materials without subsampling.
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spelling doaj.art-f63e8cbd0e7d4d7a9019b6ff971d071d2022-12-21T23:00:18ZengNature PortfolioScientific Reports2045-23222021-09-0111111410.1038/s41598-021-97915-yTunable X-ray dark-field imaging for sub-resolution feature size quantification in porous mediaBenjamin K. Blykers0Caori Organista1Matthieu N. Boone2Matias Kagias3Federica Marone4Marco Stampanoni5Tom Bultreys6Veerle Cnudde7Jan Aelterman8Pore-Scale Processes in Geomaterials Research Group (PProGRess), Department of Geology, Ghent UniversitySwiss Light Source, Paul Scherrer InstituteGhent University Centre for X-Ray Tomography (UGCT)Swiss Light Source, Paul Scherrer InstituteSwiss Light Source, Paul Scherrer InstituteSwiss Light Source, Paul Scherrer InstitutePore-Scale Processes in Geomaterials Research Group (PProGRess), Department of Geology, Ghent UniversityPore-Scale Processes in Geomaterials Research Group (PProGRess), Department of Geology, Ghent UniversityGhent University Centre for X-Ray Tomography (UGCT)Abstract X-ray computed micro-tomography typically involves a trade-off between sample size and resolution, complicating the study at a micrometer scale of representative volumes of materials with broad feature size distributions (e.g. natural stones). X-ray dark-field tomography exploits scattering to probe sub-resolution features, promising to overcome this trade-off. In this work, we present a quantification method for sub-resolution feature sizes using dark-field tomograms obtained by tuning the autocorrelation length of a Talbot grating interferometer. Alumina particles with different nominal pore sizes (50 nm and 150 nm) were mixed and imaged at the TOMCAT beamline of the SLS synchrotron (PSI) at eighteen correlation lengths, covering the pore size range. The different particles cannot be distinguished by traditional absorption µCT due to their very similar density and the pores being unresolved at typical image resolutions. Nevertheless, by exploiting the scattering behavior of the samples, the proposed analysis method allowed to quantify the nominal pore sizes of individual particles. The robustness of this quantification was proven by reproducing the experiment with solid samples of alumina, and alumina particles that were kept separated. Our findings demonstrate the possibility to calibrate dark-field image analysis to quantify sub-resolution feature sizes, allowing multi-scale analyses of heterogeneous materials without subsampling.https://doi.org/10.1038/s41598-021-97915-y
spellingShingle Benjamin K. Blykers
Caori Organista
Matthieu N. Boone
Matias Kagias
Federica Marone
Marco Stampanoni
Tom Bultreys
Veerle Cnudde
Jan Aelterman
Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media
Scientific Reports
title Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media
title_full Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media
title_fullStr Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media
title_full_unstemmed Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media
title_short Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media
title_sort tunable x ray dark field imaging for sub resolution feature size quantification in porous media
url https://doi.org/10.1038/s41598-021-97915-y
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