Low energy Xe+ sputter yields for alumina, Hiperco 50, and boron nitride

Electric thruster materials are often subject to erosion during normal device operation. As a result of the ion sputtering process, surface properties can be affected or the underlying material may be exposed, possibly compromising performance and/or lifetime. It is therefore important to know both...

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Main Authors: Mark W. Crofton, Jason A. Young
Format: Article
Language:English
Published: AIP Publishing LLC 2021-12-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0067346
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author Mark W. Crofton
Jason A. Young
author_facet Mark W. Crofton
Jason A. Young
author_sort Mark W. Crofton
collection DOAJ
description Electric thruster materials are often subject to erosion during normal device operation. As a result of the ion sputtering process, surface properties can be affected or the underlying material may be exposed, possibly compromising performance and/or lifetime. It is therefore important to know both the energy and angle dependence of total sputter yield for relevant materials so that these effects can be predicted. In this study, we have obtained limited datasets on three materials with applications in electric propulsion development, thruster-spacecraft integration, and other technological areas—alumina, Hiperco 50, and HP boron nitride—in order to augment the material properties database. For each case, angular profiles were obtained at a single ion incidence energy, and energy dependence was explored at normal incidence. The datasets have been least squares fitted, and the results were interpreted.
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spelling doaj.art-f64dd27228df418388085ae5c386894a2022-12-22T04:03:54ZengAIP Publishing LLCAIP Advances2158-32262021-12-011112125126125126-910.1063/5.0067346Low energy Xe+ sputter yields for alumina, Hiperco 50, and boron nitrideMark W. Crofton0Jason A. Young1The Aerospace Corporation, El Segundo, California 90245, USAThe Aerospace Corporation, El Segundo, California 90245, USAElectric thruster materials are often subject to erosion during normal device operation. As a result of the ion sputtering process, surface properties can be affected or the underlying material may be exposed, possibly compromising performance and/or lifetime. It is therefore important to know both the energy and angle dependence of total sputter yield for relevant materials so that these effects can be predicted. In this study, we have obtained limited datasets on three materials with applications in electric propulsion development, thruster-spacecraft integration, and other technological areas—alumina, Hiperco 50, and HP boron nitride—in order to augment the material properties database. For each case, angular profiles were obtained at a single ion incidence energy, and energy dependence was explored at normal incidence. The datasets have been least squares fitted, and the results were interpreted.http://dx.doi.org/10.1063/5.0067346
spellingShingle Mark W. Crofton
Jason A. Young
Low energy Xe+ sputter yields for alumina, Hiperco 50, and boron nitride
AIP Advances
title Low energy Xe+ sputter yields for alumina, Hiperco 50, and boron nitride
title_full Low energy Xe+ sputter yields for alumina, Hiperco 50, and boron nitride
title_fullStr Low energy Xe+ sputter yields for alumina, Hiperco 50, and boron nitride
title_full_unstemmed Low energy Xe+ sputter yields for alumina, Hiperco 50, and boron nitride
title_short Low energy Xe+ sputter yields for alumina, Hiperco 50, and boron nitride
title_sort low energy xe sputter yields for alumina hiperco 50 and boron nitride
url http://dx.doi.org/10.1063/5.0067346
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