Kinetics of Ni, V and Fe Leaching from a Spent Catalyst in Microwave-Assisted Acid Activation Process

Ni, V and Fe are the main contaminant metals that lead to the deactivation of the spent fluid catalytic cracking (SFCC) catalyst. In this work, the properties and distribution of Ni, V and Fe in the SFCC catalyst are investigated by employing EPMA-EDX, SEM and XPS techniques. The kinetics of Ni, V,...

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Bibliographic Details
Main Authors: Tian Wang, Jing Ren, Annavarapu V. Ravindra, Yan Lv, Thiquynhxuan Le
Format: Article
Language:English
Published: MDPI AG 2022-03-01
Series:Molecules
Subjects:
Online Access:https://www.mdpi.com/1420-3049/27/7/2078
Description
Summary:Ni, V and Fe are the main contaminant metals that lead to the deactivation of the spent fluid catalytic cracking (SFCC) catalyst. In this work, the properties and distribution of Ni, V and Fe in the SFCC catalyst are investigated by employing EPMA-EDX, SEM and XPS techniques. The kinetics of Ni, V, Fe and Al leaching in organic and inorganic acids are studied under microwave heating. The EPMA-EDX results show that Fe and Ni mainly accumulate near the particle surface, while V eventually distributes throughout the catalyst particle. The XPS result suggests that the phase speciations of Ni in the SFCC catalyst are Ni, Ni<sub>2</sub>SiO<sub>4</sub> and NiAl<sub>2</sub>O<sub>4</sub>, while Fe is present in a mixture of Fe<sub>3</sub>O<sub>4</sub>, Fe<sub>2</sub>O<sub>3</sub> and Fe<sub>2</sub>SiO<sub>4</sub>. V is in the forms of V<sub>2</sub>O<sub>5</sub> and VO<sub>2</sub>. Compared with oxalic acid, sulfuric acid has a better removal effect of contaminant metals, especially for Ni. The leaching kinetics results indicate that using either sulfuric acid or oxalic acid, the apparent activation energy of V is obviously lower than that of Fe and Ni, and the priority of the three contaminant metals in the removal effect is V > Fe > Ni. In addition, the leaching kinetics of contaminant metals in the microwave-assisted acid activation process are controlled by the surface chemical reaction control model.
ISSN:1420-3049