Dielectric properties of Al and Ti co-doped Bi2VO5.5-δ system
The Polycrystalline ceramic samples with formula unit Bi2V1-xTix/2Alx/2O5.5-δ (x = 0.1 and 0.175) were synthesized. The specimens were characterized by AC Impedance Spectroscopy for dielectric studies. The variation of dielectric parameters: dielectric constant ( ), dielectric loss (tan ), complex e...
Main Authors: | Diptimayee Tripathy, Amarjyoti Saikia, Gyati Tachang Tado, Arvind Pandey |
---|---|
Format: | Article |
Language: | English |
Published: |
Applied Science Innovations Private Limited
2019-06-01
|
Series: | Carbon: Science and Technology |
Subjects: | |
Online Access: | http://www.applied-science-innovations.com/cst-web-site/CST-11-2-2019/CST-359-11-2-2019-72-77.pdf |
Similar Items
-
Dielectric study of La2-xTbxMo2O9 (x=0.1, 0.2, 0.5) oxygen ion conductor
by: Gyati Tachang Tado, et al.
Published: (2019-06-01) -
Role of Al and Ti doping in modulating electrical properties of BIVOX system
by: Diptimayee Tripathy, et al.
Published: (2019-12-01) -
Enhanced dielectric properties of zinc doped bentonite composites: an effect of cobalt doping concentrations and tight binding calculation
by: Ali H. Bashal, et al.
Published: (2023-11-01) -
Characterization of Mechanical and Dielectric Properties of Silicone Rubber
by: Eunyoung Cho, et al.
Published: (2021-06-01) -
Characterization of Dielectric Properties of Graphene and Graphite Using the Resonant Cavity in 5G Test Band
by: Vinicius M. Pereira, et al.
Published: (2023-03-01)