Short Circuit and Recovery Time Tests in a helical bifilar R-SFCL module

Abstract Superconducting Fault Current Limiter (SFCL) modules with distinct arrangements have been investigated, seeking design and performance enhancements. In this context, this work aims to propose a design for resistive SFCL (R-SFCL) modules, using RE-Ba-Cu-O high-temperature superconducting tap...

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Main Authors: Luís M. M. Rocha, Alexander Polasek, Guilherme G. Sotelo, D. H. N. Dias, Bruno S. M. C. Borba, David P. Fernandes
Format: Article
Language:English
Published: Sociedade Brasileira de Microondas e Optoeletrônica; Sociedade Brasileira de Eletromagnetismo 2021-06-01
Series:Journal of Microwaves, Optoelectronics and Electromagnetic Applications
Subjects:
Online Access:http://www.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742021000200372&tlng=en
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author Luís M. M. Rocha
Alexander Polasek
Guilherme G. Sotelo
D. H. N. Dias
Bruno S. M. C. Borba
David P. Fernandes
author_facet Luís M. M. Rocha
Alexander Polasek
Guilherme G. Sotelo
D. H. N. Dias
Bruno S. M. C. Borba
David P. Fernandes
author_sort Luís M. M. Rocha
collection DOAJ
description Abstract Superconducting Fault Current Limiter (SFCL) modules with distinct arrangements have been investigated, seeking design and performance enhancements. In this context, this work aims to propose a design for resistive SFCL (R-SFCL) modules, using RE-Ba-Cu-O high-temperature superconducting tapes (HTS) wound on an alternative support material. An R-SFCL bench prototype was designed for 400 A and 500 V. Two pieces of 2G tapes, arranged in a bifilar antiparallel configuration were wound on Acrylonitrile Butadiene Styrene (ABS) tubes, which were made by means of a 3D printer. During the experiments, the SFCL was immersed in an open bath cryostat with liquid nitrogen and several measurements were carried out. The average limited current is about three times lower than the prospective one. To test the SFCL recovery time, the following procedure was adopted: The fault is induced during three cycles, and after, the current is reduced to zero. The SFCL is reconnected after some time considering that the fault was extinct, and the voltage level returned to normal operation. The results showed promising levels of limitation and recovery time for further developments.
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spelling doaj.art-f7cc0b1940d54ea9bece4afe7f61aad02022-12-21T19:35:44ZengSociedade Brasileira de Microondas e Optoeletrônica; Sociedade Brasileira de EletromagnetismoJournal of Microwaves, Optoelectronics and Electromagnetic Applications2179-10742021-06-0120237238110.1590/2179-10742021v20i21076Short Circuit and Recovery Time Tests in a helical bifilar R-SFCL moduleLuís M. M. Rochahttps://orcid.org/0000-0003-1067-0860Alexander Polasekhttps://orcid.org/0000-0002-6973-3582Guilherme G. Sotelohttps://orcid.org/0000-0002-5393-7206D. H. N. Diashttps://orcid.org/0000-0003-3257-8491Bruno S. M. C. Borbahttps://orcid.org/0000-0002-7031-0237David P. Fernandeshttps://orcid.org/0000-0001-6217-0628Abstract Superconducting Fault Current Limiter (SFCL) modules with distinct arrangements have been investigated, seeking design and performance enhancements. In this context, this work aims to propose a design for resistive SFCL (R-SFCL) modules, using RE-Ba-Cu-O high-temperature superconducting tapes (HTS) wound on an alternative support material. An R-SFCL bench prototype was designed for 400 A and 500 V. Two pieces of 2G tapes, arranged in a bifilar antiparallel configuration were wound on Acrylonitrile Butadiene Styrene (ABS) tubes, which were made by means of a 3D printer. During the experiments, the SFCL was immersed in an open bath cryostat with liquid nitrogen and several measurements were carried out. The average limited current is about three times lower than the prospective one. To test the SFCL recovery time, the following procedure was adopted: The fault is induced during three cycles, and after, the current is reduced to zero. The SFCL is reconnected after some time considering that the fault was extinct, and the voltage level returned to normal operation. The results showed promising levels of limitation and recovery time for further developments.http://www.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742021000200372&tlng=enRE-Ba-Cu-O HTS tapesR-SFCLShort-circuit3D printer
spellingShingle Luís M. M. Rocha
Alexander Polasek
Guilherme G. Sotelo
D. H. N. Dias
Bruno S. M. C. Borba
David P. Fernandes
Short Circuit and Recovery Time Tests in a helical bifilar R-SFCL module
Journal of Microwaves, Optoelectronics and Electromagnetic Applications
RE-Ba-Cu-O HTS tapes
R-SFCL
Short-circuit
3D printer
title Short Circuit and Recovery Time Tests in a helical bifilar R-SFCL module
title_full Short Circuit and Recovery Time Tests in a helical bifilar R-SFCL module
title_fullStr Short Circuit and Recovery Time Tests in a helical bifilar R-SFCL module
title_full_unstemmed Short Circuit and Recovery Time Tests in a helical bifilar R-SFCL module
title_short Short Circuit and Recovery Time Tests in a helical bifilar R-SFCL module
title_sort short circuit and recovery time tests in a helical bifilar r sfcl module
topic RE-Ba-Cu-O HTS tapes
R-SFCL
Short-circuit
3D printer
url http://www.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742021000200372&tlng=en
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AT dhndias shortcircuitandrecoverytimetestsinahelicalbifilarrsfclmodule
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