Effect of Substrate and Thickness on the Photoconductivity of Nanoparticle Titanium Dioxide Thin Film Vacuum Ultraviolet Photoconductive Detector
Vacuum ultraviolet radiation (VUV, from 100 nm to 200 nm wavelength) is indispensable in many applications, but its detection is still challenging. We report the development of a VUV photoconductive detector, based on titanium dioxide (TiO<sub>2</sub>) nanoparticle thin films. The effect...
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| Format: | Article |
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MDPI AG
2021-12-01
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| Series: | Nanomaterials |
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| Online Access: | https://www.mdpi.com/2079-4991/12/1/10 |
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| author | Marilou Cadatal-Raduban Tomoki Kato Yusuke Horiuchi Jiří Olejníček Michal Kohout Kohei Yamanoi Shingo Ono |
| author_facet | Marilou Cadatal-Raduban Tomoki Kato Yusuke Horiuchi Jiří Olejníček Michal Kohout Kohei Yamanoi Shingo Ono |
| author_sort | Marilou Cadatal-Raduban |
| collection | DOAJ |
| description | Vacuum ultraviolet radiation (VUV, from 100 nm to 200 nm wavelength) is indispensable in many applications, but its detection is still challenging. We report the development of a VUV photoconductive detector, based on titanium dioxide (TiO<sub>2</sub>) nanoparticle thin films. The effect of crystallinity, optical quality, and crystallite size due to film thickness (80 nm, 500 nm, 1000 nm) and type of substrate (silicon Si, quartz SiO<sub>2</sub>, soda lime glass SLG) was investigated to explore ways of enhancing the photoconductivity of the detector. The TiO<sub>2</sub> film deposited on SiO<sub>2</sub> substrate with a film thickness of 80 nm exhibited the best photoconductivity, with a photocurrent of 5.35 milli-Amperes and a photosensitivity of 99.99% for a bias voltage of 70 V. The wavelength response of the detector can be adjusted by changing the thickness of the film as the cut-off shifts to a longer wavelength, as the film becomes thicker. The response time of the TiO<sub>2</sub> detector is about 5.8 μs and is comparable to the 5.4 μs response time of a diamond UV sensor. The development of the TiO<sub>2</sub> nanoparticle thin film detector is expected to contribute to the enhancement of the use of VUV radiation in an increasing number of important technological and scientific applications. |
| first_indexed | 2024-03-10T03:29:29Z |
| format | Article |
| id | doaj.art-f7fd89201ff049d09d09eaa4e4010d52 |
| institution | Directory Open Access Journal |
| issn | 2079-4991 |
| language | English |
| last_indexed | 2024-03-10T03:29:29Z |
| publishDate | 2021-12-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Nanomaterials |
| spelling | doaj.art-f7fd89201ff049d09d09eaa4e4010d522023-11-23T12:00:11ZengMDPI AGNanomaterials2079-49912021-12-011211010.3390/nano12010010Effect of Substrate and Thickness on the Photoconductivity of Nanoparticle Titanium Dioxide Thin Film Vacuum Ultraviolet Photoconductive DetectorMarilou Cadatal-Raduban0Tomoki Kato1Yusuke Horiuchi2Jiří Olejníček3Michal Kohout4Kohei Yamanoi5Shingo Ono6Centre for Theoretical Chemistry and Physics, School of Natural and Computational Sciences, Massey University, Auckland 0632, New ZealandDepartment of Physical Science and Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Aichi, JapanDepartment of Physical Science and Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Aichi, JapanDepartment of Low-Temperature Plasma, Institute of Physics, Czech Academy of Sciences, Na Slovance 2, 182 21 Prague, Czech RepublicDepartment of Low-Temperature Plasma, Institute of Physics, Czech Academy of Sciences, Na Slovance 2, 182 21 Prague, Czech RepublicInstitute of Laser Engineering, Osaka University, 2-6 Yamadaoka, Suita 565-0871, Osaka, JapanDepartment of Physical Science and Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Aichi, JapanVacuum ultraviolet radiation (VUV, from 100 nm to 200 nm wavelength) is indispensable in many applications, but its detection is still challenging. We report the development of a VUV photoconductive detector, based on titanium dioxide (TiO<sub>2</sub>) nanoparticle thin films. The effect of crystallinity, optical quality, and crystallite size due to film thickness (80 nm, 500 nm, 1000 nm) and type of substrate (silicon Si, quartz SiO<sub>2</sub>, soda lime glass SLG) was investigated to explore ways of enhancing the photoconductivity of the detector. The TiO<sub>2</sub> film deposited on SiO<sub>2</sub> substrate with a film thickness of 80 nm exhibited the best photoconductivity, with a photocurrent of 5.35 milli-Amperes and a photosensitivity of 99.99% for a bias voltage of 70 V. The wavelength response of the detector can be adjusted by changing the thickness of the film as the cut-off shifts to a longer wavelength, as the film becomes thicker. The response time of the TiO<sub>2</sub> detector is about 5.8 μs and is comparable to the 5.4 μs response time of a diamond UV sensor. The development of the TiO<sub>2</sub> nanoparticle thin film detector is expected to contribute to the enhancement of the use of VUV radiation in an increasing number of important technological and scientific applications.https://www.mdpi.com/2079-4991/12/1/10nanoparticlethin filmtitanium dioxidewide band gapsemiconductorvacuum ultraviolet |
| spellingShingle | Marilou Cadatal-Raduban Tomoki Kato Yusuke Horiuchi Jiří Olejníček Michal Kohout Kohei Yamanoi Shingo Ono Effect of Substrate and Thickness on the Photoconductivity of Nanoparticle Titanium Dioxide Thin Film Vacuum Ultraviolet Photoconductive Detector Nanomaterials nanoparticle thin film titanium dioxide wide band gap semiconductor vacuum ultraviolet |
| title | Effect of Substrate and Thickness on the Photoconductivity of Nanoparticle Titanium Dioxide Thin Film Vacuum Ultraviolet Photoconductive Detector |
| title_full | Effect of Substrate and Thickness on the Photoconductivity of Nanoparticle Titanium Dioxide Thin Film Vacuum Ultraviolet Photoconductive Detector |
| title_fullStr | Effect of Substrate and Thickness on the Photoconductivity of Nanoparticle Titanium Dioxide Thin Film Vacuum Ultraviolet Photoconductive Detector |
| title_full_unstemmed | Effect of Substrate and Thickness on the Photoconductivity of Nanoparticle Titanium Dioxide Thin Film Vacuum Ultraviolet Photoconductive Detector |
| title_short | Effect of Substrate and Thickness on the Photoconductivity of Nanoparticle Titanium Dioxide Thin Film Vacuum Ultraviolet Photoconductive Detector |
| title_sort | effect of substrate and thickness on the photoconductivity of nanoparticle titanium dioxide thin film vacuum ultraviolet photoconductive detector |
| topic | nanoparticle thin film titanium dioxide wide band gap semiconductor vacuum ultraviolet |
| url | https://www.mdpi.com/2079-4991/12/1/10 |
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