Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEM
ABSTRACTContrary to the conventional belief that, in transmission electron microscopy (TEM), selective and sharp imaging of dislocation loops can be realized only by accurate tilting of a specimen from the condition that the symmetrical axis of incident electron beam distribution is parallel to a zo...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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Taylor & Francis Group
2024-12-01
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| Series: | Philosophical Magazine Letters |
| Subjects: | |
| Online Access: | https://www.tandfonline.com/doi/10.1080/09500839.2024.2321134 |
| _version_ | 1797290239886098432 |
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| author | Masaya Kozuka Yuichi Miyahara Tomohiro Kobayashi |
| author_facet | Masaya Kozuka Yuichi Miyahara Tomohiro Kobayashi |
| author_sort | Masaya Kozuka |
| collection | DOAJ |
| description | ABSTRACTContrary to the conventional belief that, in transmission electron microscopy (TEM), selective and sharp imaging of dislocation loops can be realized only by accurate tilting of a specimen from the condition that the symmetrical axis of incident electron beam distribution is parallel to a zone axis of the TEM specimen (on-zone condition), we demonstrate that selective dark-field (DF) imaging of dislocation loops at on-zone condition is possible with a scanning TEM (STEM) mode that uses an objective lens aperture to select a diffraction disk of interest. Diffraction-selected on-zone STEM (DsoZ-STEM) has been applied to selective DF imaging of dislocation loops with a short axis length of <2 nm in a single-crystal aluminum irradiated by argon ions and an electron beam at room temperature. It was found that a Kikuchi line enhances the contrast among the dislocation loops and the matrix of DsoZ-STEM images. DsoZ-STEM obeyed g·b invisibility criterion and showed good agreement with a typical visibility change of a dislocation line and a loop in conventional DF images with a specific pair of [Formula: see text]g. In addition, dislocation loops always showed much higher brightness in the inner side compared to the outer side in DsoZ-STEM images, simplifying the distinction of dislocation loops with apparently the same long-axis direction but different b. Thus, DsoZ-STEM can simplify the selective DF imaging for the determination of the number and the character of dislocation loops. |
| first_indexed | 2024-03-07T19:18:36Z |
| format | Article |
| id | doaj.art-f84c621bb3084882a2a088155b052756 |
| institution | Directory Open Access Journal |
| issn | 0950-0839 1362-3036 |
| language | English |
| last_indexed | 2024-03-07T19:18:36Z |
| publishDate | 2024-12-01 |
| publisher | Taylor & Francis Group |
| record_format | Article |
| series | Philosophical Magazine Letters |
| spelling | doaj.art-f84c621bb3084882a2a088155b0527562024-02-29T12:00:04ZengTaylor & Francis GroupPhilosophical Magazine Letters0950-08391362-30362024-12-01104110.1080/09500839.2024.2321134Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEMMasaya Kozuka0Yuichi Miyahara1Tomohiro Kobayashi2Energy Transformation Research Laboratory, Central Research Institute of Electric Power Industry, Yokosuka, JapanEnergy Transformation Research Laboratory, Central Research Institute of Electric Power Industry, Yokosuka, JapanEnergy Transformation Research Laboratory, Central Research Institute of Electric Power Industry, Yokosuka, JapanABSTRACTContrary to the conventional belief that, in transmission electron microscopy (TEM), selective and sharp imaging of dislocation loops can be realized only by accurate tilting of a specimen from the condition that the symmetrical axis of incident electron beam distribution is parallel to a zone axis of the TEM specimen (on-zone condition), we demonstrate that selective dark-field (DF) imaging of dislocation loops at on-zone condition is possible with a scanning TEM (STEM) mode that uses an objective lens aperture to select a diffraction disk of interest. Diffraction-selected on-zone STEM (DsoZ-STEM) has been applied to selective DF imaging of dislocation loops with a short axis length of <2 nm in a single-crystal aluminum irradiated by argon ions and an electron beam at room temperature. It was found that a Kikuchi line enhances the contrast among the dislocation loops and the matrix of DsoZ-STEM images. DsoZ-STEM obeyed g·b invisibility criterion and showed good agreement with a typical visibility change of a dislocation line and a loop in conventional DF images with a specific pair of [Formula: see text]g. In addition, dislocation loops always showed much higher brightness in the inner side compared to the outer side in DsoZ-STEM images, simplifying the distinction of dislocation loops with apparently the same long-axis direction but different b. Thus, DsoZ-STEM can simplify the selective DF imaging for the determination of the number and the character of dislocation loops.https://www.tandfonline.com/doi/10.1080/09500839.2024.2321134STEMdislocation loopsdiffraction contrastirradiation damage |
| spellingShingle | Masaya Kozuka Yuichi Miyahara Tomohiro Kobayashi Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEM Philosophical Magazine Letters STEM dislocation loops diffraction contrast irradiation damage |
| title | Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEM |
| title_full | Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEM |
| title_fullStr | Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEM |
| title_full_unstemmed | Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEM |
| title_short | Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEM |
| title_sort | simplification of selective imaging of dislocation loops diffraction selected on zone stem |
| topic | STEM dislocation loops diffraction contrast irradiation damage |
| url | https://www.tandfonline.com/doi/10.1080/09500839.2024.2321134 |
| work_keys_str_mv | AT masayakozuka simplificationofselectiveimagingofdislocationloopsdiffractionselectedonzonestem AT yuichimiyahara simplificationofselectiveimagingofdislocationloopsdiffractionselectedonzonestem AT tomohirokobayashi simplificationofselectiveimagingofdislocationloopsdiffractionselectedonzonestem |