Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEM

Simplification of selective imaging of dislocation loops: diffraction-selected on-zone STEM

Contrary to the conventional belief that, in transmission electron microscopy (TEM), selective and sharp imaging of dislocation loops can be realized only by accurate tilting of a specimen from the condition that the symmetrical axis of incident electron beam distribution is parallel to a zone axis...

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Bibliographic Details
Main Authors: Masaya Kozuka, Yuichi Miyahara, Tomohiro Kobayashi
Format: Article
Language:English
Published: Taylor & Francis Group 2024-12-01
Series:Philosophical Magazine Letters
Subjects:
STEM
dislocation loops
diffraction contrast
irradiation damage
Online Access:https://www.tandfonline.com/doi/10.1080/09500839.2024.2321134

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