Stable dielectric response in lead-free relaxor K0.5Na0.5NbO3–SrTiO3 thin films
K0.5Na0.5NbO3–SrTiO3 (KNN–STO) thin films of different compositions were prepared by the chemical solution deposition method. While structural investigations confirmed the formation of perovskite solid solution in all developed films, dielectric experiments revealed a relaxor broad dispersive maximu...
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| Format: | Article |
| Language: | English |
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World Scientific Publishing
2014-04-01
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| Series: | Journal of Advanced Dielectrics |
| Subjects: | |
| Online Access: | http://www.worldscientific.com/doi/pdf/10.1142/S2010135X1450012X |
| _version_ | 1818586220732612608 |
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| author | A. Eršte A. Kupec B. Kmet B. Malič V. Bobnar |
| author_facet | A. Eršte A. Kupec B. Kmet B. Malič V. Bobnar |
| author_sort | A. Eršte |
| collection | DOAJ |
| description | K0.5Na0.5NbO3–SrTiO3 (KNN–STO) thin films of different compositions were prepared by the chemical solution deposition method. While structural investigations confirmed the formation of perovskite solid solution in all developed films, dielectric experiments revealed a relaxor broad dispersive maximum in the sample with 15 mol% of STO, exhibiting for a thin film high ε′ ~ 330 at ~ 210 K. The history-dependent effects of this relaxor sample were compared to those of KNN–STO ceramics and, furthermore, shown to be much weaker than in widely used lead-based ferroelectric and relaxor (Pb,La)(Zr,Ti)O3 ceramics: While fatigue endurance results revealed a slight drop in polarization after 3 × 105 switching cycles, the results of aging of the dielectric constant revealed no notable decrease in its values after 106 s. |
| first_indexed | 2024-12-16T08:49:30Z |
| format | Article |
| id | doaj.art-fa021737d38b4629a92562c7684025bf |
| institution | Directory Open Access Journal |
| issn | 2010-135X 2010-1368 |
| language | English |
| last_indexed | 2024-12-16T08:49:30Z |
| publishDate | 2014-04-01 |
| publisher | World Scientific Publishing |
| record_format | Article |
| series | Journal of Advanced Dielectrics |
| spelling | doaj.art-fa021737d38b4629a92562c7684025bf2022-12-21T22:37:30ZengWorld Scientific PublishingJournal of Advanced Dielectrics2010-135X2010-13682014-04-01421450012-11450012-510.1142/S2010135X1450012X10.1142/S2010135X1450012XStable dielectric response in lead-free relaxor K0.5Na0.5NbO3–SrTiO3 thin filmsA. Eršte0A. Kupec1B. Kmet2B. Malič3V. Bobnar4Condensed Matter Physics Department, Jožef Stefan Institute, Jamova cesta 39, SI-1000 Ljubljana, SloveniaElectronic Ceramics Department, Jožef Stefan Institute, Jamova cesta 39, SI-1000 Ljubljana, SloveniaElectronic Ceramics Department, Jožef Stefan Institute, Jamova cesta 39, SI-1000 Ljubljana, SloveniaElectronic Ceramics Department, Jožef Stefan Institute, Jamova cesta 39, SI-1000 Ljubljana, SloveniaCondensed Matter Physics Department, Jožef Stefan Institute, Jamova cesta 39, SI-1000 Ljubljana, SloveniaK0.5Na0.5NbO3–SrTiO3 (KNN–STO) thin films of different compositions were prepared by the chemical solution deposition method. While structural investigations confirmed the formation of perovskite solid solution in all developed films, dielectric experiments revealed a relaxor broad dispersive maximum in the sample with 15 mol% of STO, exhibiting for a thin film high ε′ ~ 330 at ~ 210 K. The history-dependent effects of this relaxor sample were compared to those of KNN–STO ceramics and, furthermore, shown to be much weaker than in widely used lead-based ferroelectric and relaxor (Pb,La)(Zr,Ti)O3 ceramics: While fatigue endurance results revealed a slight drop in polarization after 3 × 105 switching cycles, the results of aging of the dielectric constant revealed no notable decrease in its values after 106 s.http://www.worldscientific.com/doi/pdf/10.1142/S2010135X1450012XLead-free ceramic thin filmsrelaxor ferroelectricselectrical fatigue and aging |
| spellingShingle | A. Eršte A. Kupec B. Kmet B. Malič V. Bobnar Stable dielectric response in lead-free relaxor K0.5Na0.5NbO3–SrTiO3 thin films Journal of Advanced Dielectrics Lead-free ceramic thin films relaxor ferroelectrics electrical fatigue and aging |
| title | Stable dielectric response in lead-free relaxor K0.5Na0.5NbO3–SrTiO3 thin films |
| title_full | Stable dielectric response in lead-free relaxor K0.5Na0.5NbO3–SrTiO3 thin films |
| title_fullStr | Stable dielectric response in lead-free relaxor K0.5Na0.5NbO3–SrTiO3 thin films |
| title_full_unstemmed | Stable dielectric response in lead-free relaxor K0.5Na0.5NbO3–SrTiO3 thin films |
| title_short | Stable dielectric response in lead-free relaxor K0.5Na0.5NbO3–SrTiO3 thin films |
| title_sort | stable dielectric response in lead free relaxor k0 5na0 5nbo3 srtio3 thin films |
| topic | Lead-free ceramic thin films relaxor ferroelectrics electrical fatigue and aging |
| url | http://www.worldscientific.com/doi/pdf/10.1142/S2010135X1450012X |
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