Banana plant counting and morphological parameters measurement based on terrestrial laser scanning

Abstract Background The number of banana plants is closely related to banana yield. The diameter and height of the pseudo-stem are important morphological parameters of banana plants, which can reflect the growth status and vitality. To address the problems of high labor intensity and subjectivity i...

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Bibliographic Details
Main Authors: Yanlong Miao, Liuyang Wang, Cheng Peng, Han Li, Xiuhua Li, Man Zhang
Format: Article
Language:English
Published: BMC 2022-05-01
Series:Plant Methods
Subjects:
Online Access:https://doi.org/10.1186/s13007-022-00894-y
Description
Summary:Abstract Background The number of banana plants is closely related to banana yield. The diameter and height of the pseudo-stem are important morphological parameters of banana plants, which can reflect the growth status and vitality. To address the problems of high labor intensity and subjectivity in traditional measurement methods, a fast measurement method for banana plant count, pseudo-stem diameter, and height based on terrestrial laser scanning (TLS) was proposed. Results First, during the nutritional growth period of banana, three-dimensional (3D) point cloud data of two measured fields were obtained by TLS. Second, the point cloud data was preprocessed. And the single plant segmentation of the canopy closed banana plant point cloud was realized furtherly. Finally, the number of banana plants was obtained by counting the number of pseudo-stems, and the diameter of pseudo-stems was measured using a cylindrical segmentation algorithm. A sliding window recognition method was proposed to determine the junction position between leaves and pseudo-stems, and the height of the pseudo-stems was measured. Compared with the measured value of artificial point cloud, when counting the number of banana plants, the precision,recall and percentage error of field 1 were 93.51%, 94.02%, and 0.54% respectively; the precision,recall and percentage error of field 2 were 96.34%, 92.00%, and 4.5% respectively; In the measurement of pseudo-stem diameter and height of banana, the root mean square error (RMSE) of pseudo-stem diameter and height of banana plant in field 1 were 0.38 cm and 0.2014 m respectively, and the mean absolute percentage error (MAPE) were 1.30% and 5.11% respectively; the RMSE of pseudo-stem diameter and height of banana plant in field 2 were 0.39 cm and 0.2788 m respectively, and the MAPE were 1.04% and 9.40% respectively. Conclusion The results show that the method proposed in this paper is suitable for the field measurement of banana count, pseudo-stem diameter, and height and can provide a fast field measurement method for banana plantation management.
ISSN:1746-4811