Banana plant counting and morphological parameters measurement based on terrestrial laser scanning

Banana plant counting and morphological parameters measurement based on terrestrial laser scanning

Abstract Background The number of banana plants is closely related to banana yield. The diameter and height of the pseudo-stem are important morphological parameters of banana plants, which can reflect the growth status and vitality. To address the problems of high labor intensity and subjectivity i...

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Bibliographic Details
Main Authors: Yanlong Miao, Liuyang Wang, Cheng Peng, Han Li, Xiuhua Li, Man Zhang
Format: Article
Language:English
Published: BMC 2022-05-01
Series:Plant Methods
Subjects:
Banana
Counting
Pseudo-stem diameter
Pseudo-stem height
Terrestrial laser scanning
Point cloud
Online Access:https://doi.org/10.1186/s13007-022-00894-y

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