Improved Single-Shot Qubit Readout Using Twin rf-SET Charge Correlations
High-fidelity qubit readout is critical in order to obtain the thresholds needed to implement quantum error-correction protocols and achieve fault-tolerant quantum computing. Large-scale silicon qubit devices will have densely packed arrays of quantum dots with multiple charge sensors that are, on a...
Main Authors: | , , , , , , , , , , , , , |
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Format: | Article |
Language: | English |
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American Physical Society
2024-01-01
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Series: | PRX Quantum |
Online Access: | http://doi.org/10.1103/PRXQuantum.5.010301 |
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author | Santiago Serrano MengKe Feng Wee Han Lim Amanda E. Seedhouse Tuomo Tanttu Will Gilbert Christopher C. Escott Nikolay V. Abrosimov Hans-Joachim Pohl Michael L.W. Thewalt Fay E. Hudson Andre Saraiva Andrew S. Dzurak Arne Laucht |
author_facet | Santiago Serrano MengKe Feng Wee Han Lim Amanda E. Seedhouse Tuomo Tanttu Will Gilbert Christopher C. Escott Nikolay V. Abrosimov Hans-Joachim Pohl Michael L.W. Thewalt Fay E. Hudson Andre Saraiva Andrew S. Dzurak Arne Laucht |
author_sort | Santiago Serrano |
collection | DOAJ |
description | High-fidelity qubit readout is critical in order to obtain the thresholds needed to implement quantum error-correction protocols and achieve fault-tolerant quantum computing. Large-scale silicon qubit devices will have densely packed arrays of quantum dots with multiple charge sensors that are, on average, farther away from the quantum dots, entailing a reduction in readout fidelities. Here, we present a readout technique that enhances the readout fidelity in a linear SiMOS four-dot array by amplifying correlations between a pair of single-electron transistors, known as a twin SET. By recording and subsequently correlating the twin SET traces as we modulate the dot detuning across a charge transition, we demonstrate a reduction in the charge readout infidelity by over one order of magnitude compared to traditional readout methods. We also study the spin-to-charge conversion errors introduced by the modulation technique and conclude that faster modulation frequencies avoid relaxation-induced errors without introducing significant spin-flip errors, favoring the use of the technique at short integration times. This method not only allows for faster and higher-fidelity qubit measurements but it also enhances the signal corresponding to charge transitions that take place farther away from the sensors, enabling a way to circumvent the reduction in readout fidelities in large arrays of qubits. |
first_indexed | 2024-03-08T17:15:22Z |
format | Article |
id | doaj.art-faf768fd287e42e2babd92f06661f786 |
institution | Directory Open Access Journal |
issn | 2691-3399 |
language | English |
last_indexed | 2024-03-08T17:15:22Z |
publishDate | 2024-01-01 |
publisher | American Physical Society |
record_format | Article |
series | PRX Quantum |
spelling | doaj.art-faf768fd287e42e2babd92f06661f7862024-01-03T15:01:50ZengAmerican Physical SocietyPRX Quantum2691-33992024-01-015101030110.1103/PRXQuantum.5.010301Improved Single-Shot Qubit Readout Using Twin rf-SET Charge CorrelationsSantiago SerranoMengKe FengWee Han LimAmanda E. SeedhouseTuomo TanttuWill GilbertChristopher C. EscottNikolay V. AbrosimovHans-Joachim PohlMichael L.W. ThewaltFay E. HudsonAndre SaraivaAndrew S. DzurakArne LauchtHigh-fidelity qubit readout is critical in order to obtain the thresholds needed to implement quantum error-correction protocols and achieve fault-tolerant quantum computing. Large-scale silicon qubit devices will have densely packed arrays of quantum dots with multiple charge sensors that are, on average, farther away from the quantum dots, entailing a reduction in readout fidelities. Here, we present a readout technique that enhances the readout fidelity in a linear SiMOS four-dot array by amplifying correlations between a pair of single-electron transistors, known as a twin SET. By recording and subsequently correlating the twin SET traces as we modulate the dot detuning across a charge transition, we demonstrate a reduction in the charge readout infidelity by over one order of magnitude compared to traditional readout methods. We also study the spin-to-charge conversion errors introduced by the modulation technique and conclude that faster modulation frequencies avoid relaxation-induced errors without introducing significant spin-flip errors, favoring the use of the technique at short integration times. This method not only allows for faster and higher-fidelity qubit measurements but it also enhances the signal corresponding to charge transitions that take place farther away from the sensors, enabling a way to circumvent the reduction in readout fidelities in large arrays of qubits.http://doi.org/10.1103/PRXQuantum.5.010301 |
spellingShingle | Santiago Serrano MengKe Feng Wee Han Lim Amanda E. Seedhouse Tuomo Tanttu Will Gilbert Christopher C. Escott Nikolay V. Abrosimov Hans-Joachim Pohl Michael L.W. Thewalt Fay E. Hudson Andre Saraiva Andrew S. Dzurak Arne Laucht Improved Single-Shot Qubit Readout Using Twin rf-SET Charge Correlations PRX Quantum |
title | Improved Single-Shot Qubit Readout Using Twin rf-SET Charge Correlations |
title_full | Improved Single-Shot Qubit Readout Using Twin rf-SET Charge Correlations |
title_fullStr | Improved Single-Shot Qubit Readout Using Twin rf-SET Charge Correlations |
title_full_unstemmed | Improved Single-Shot Qubit Readout Using Twin rf-SET Charge Correlations |
title_short | Improved Single-Shot Qubit Readout Using Twin rf-SET Charge Correlations |
title_sort | improved single shot qubit readout using twin rf set charge correlations |
url | http://doi.org/10.1103/PRXQuantum.5.010301 |
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