Scintillation Properties of Pr-Doped Lanthanum Pyrosilicate Single Crystals
Five samples of lanthanum pyrosilicate (La<sub>2</sub>Si<sub>2</sub>O<sub>7</sub>) single crystals with 0.5–10.0% Praseodymium (Pr)-doping concentrations were synthesized by the floating-zone method. Photoluminescence and scintillation properties of these crystals...
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MDPI AG
2022-03-01
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| Series: | Crystals |
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| Online Access: | https://www.mdpi.com/2073-4352/12/4/459 |
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| author | Prom Kantuptim Takumi Kato Daisuke Nakauchi Noriaki Kawaguchi Takayuki Yanagida |
| author_facet | Prom Kantuptim Takumi Kato Daisuke Nakauchi Noriaki Kawaguchi Takayuki Yanagida |
| author_sort | Prom Kantuptim |
| collection | DOAJ |
| description | Five samples of lanthanum pyrosilicate (La<sub>2</sub>Si<sub>2</sub>O<sub>7</sub>) single crystals with 0.5–10.0% Praseodymium (Pr)-doping concentrations were synthesized by the floating-zone method. Photoluminescence and scintillation properties of these crystals were investigated in this study for the first time. The multiple emissions from electron transitions of Pr<sup>3+</sup> were observed on both a photoluminescence emission map and scintillation spectra, including the desired emission band of Pr<sup>3+</sup> 5d–4f transition at 250–310 nm. The major photoluminescence and scintillation decay times were approximately 19 and 26 ns, respectively. When compared with commercial scintillators such as Tl-doped cesium iodide (CsI), the Pr-doped La<sub>2</sub>Si<sub>2</sub>O<sub>7</sub> samples presented a respectively low afterglow level of 32 ppm after 20 ms of X-ray irradiation. Under 662 keV γ-ray irradiation from <sup>137</sup>Cs, the 3.0% Pr-doped La<sub>2</sub>Si<sub>2</sub>O<sub>7</sub> sample presented a scintillation light yield of 3200 ph/MeV, which was the best value among the tested samples. |
| first_indexed | 2024-03-09T10:59:45Z |
| format | Article |
| id | doaj.art-fb4f1bfc619d43c1b29ab278d27b86d4 |
| institution | Directory Open Access Journal |
| issn | 2073-4352 |
| language | English |
| last_indexed | 2024-03-09T10:59:45Z |
| publishDate | 2022-03-01 |
| publisher | MDPI AG |
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| series | Crystals |
| spelling | doaj.art-fb4f1bfc619d43c1b29ab278d27b86d42023-12-01T01:23:35ZengMDPI AGCrystals2073-43522022-03-0112445910.3390/cryst12040459Scintillation Properties of Pr-Doped Lanthanum Pyrosilicate Single CrystalsProm Kantuptim0Takumi Kato1Daisuke Nakauchi2Noriaki Kawaguchi3Takayuki Yanagida4Division of Materials Science, Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma 630-0192, Nara, JapanDivision of Materials Science, Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma 630-0192, Nara, JapanDivision of Materials Science, Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma 630-0192, Nara, JapanDivision of Materials Science, Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma 630-0192, Nara, JapanDivision of Materials Science, Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma 630-0192, Nara, JapanFive samples of lanthanum pyrosilicate (La<sub>2</sub>Si<sub>2</sub>O<sub>7</sub>) single crystals with 0.5–10.0% Praseodymium (Pr)-doping concentrations were synthesized by the floating-zone method. Photoluminescence and scintillation properties of these crystals were investigated in this study for the first time. The multiple emissions from electron transitions of Pr<sup>3+</sup> were observed on both a photoluminescence emission map and scintillation spectra, including the desired emission band of Pr<sup>3+</sup> 5d–4f transition at 250–310 nm. The major photoluminescence and scintillation decay times were approximately 19 and 26 ns, respectively. When compared with commercial scintillators such as Tl-doped cesium iodide (CsI), the Pr-doped La<sub>2</sub>Si<sub>2</sub>O<sub>7</sub> samples presented a respectively low afterglow level of 32 ppm after 20 ms of X-ray irradiation. Under 662 keV γ-ray irradiation from <sup>137</sup>Cs, the 3.0% Pr-doped La<sub>2</sub>Si<sub>2</sub>O<sub>7</sub> sample presented a scintillation light yield of 3200 ph/MeV, which was the best value among the tested samples.https://www.mdpi.com/2073-4352/12/4/459lanthanum pyrosilicatePr<sup>3+</sup>photoluminescencescintillator |
| spellingShingle | Prom Kantuptim Takumi Kato Daisuke Nakauchi Noriaki Kawaguchi Takayuki Yanagida Scintillation Properties of Pr-Doped Lanthanum Pyrosilicate Single Crystals Crystals lanthanum pyrosilicate Pr<sup>3+</sup> photoluminescence scintillator |
| title | Scintillation Properties of Pr-Doped Lanthanum Pyrosilicate Single Crystals |
| title_full | Scintillation Properties of Pr-Doped Lanthanum Pyrosilicate Single Crystals |
| title_fullStr | Scintillation Properties of Pr-Doped Lanthanum Pyrosilicate Single Crystals |
| title_full_unstemmed | Scintillation Properties of Pr-Doped Lanthanum Pyrosilicate Single Crystals |
| title_short | Scintillation Properties of Pr-Doped Lanthanum Pyrosilicate Single Crystals |
| title_sort | scintillation properties of pr doped lanthanum pyrosilicate single crystals |
| topic | lanthanum pyrosilicate Pr<sup>3+</sup> photoluminescence scintillator |
| url | https://www.mdpi.com/2073-4352/12/4/459 |
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