Monitoring chip-branches failure of multichip IGBT module using change rate of gate voltage
In order to increase system reliability, it is an economical and efficient method to monitor the defective multichip insulated gate bipolar transistor (IGBT) modules, which are widely used in various high-power electronic systems. A method is presented to monitor chip-branches failure caused by bond...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2023-09-01
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| Series: | Energy Reports |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2352484723004687 |