exCTF simulator: Simulation tool for phase contrast transfer function for aberration-corrected transmission electron microscopy
Abstract Background The contrast transfer function (CTF) is an important principle in the field of transmission electron microscopy (TEM) imaging. It provides information on how the electron wave that interacted with a sample (in frequency domain) in an objective lens is transferred to the imaging s...
Main Authors: | Sang-Chul Lee, Jong-Man Jeung, Sang-Gil Lee, Jin-Gyu Kim |
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Format: | Article |
Language: | English |
Published: |
SpringerOpen
2020-07-01
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Series: | Journal of Analytical Science and Technology |
Subjects: | |
Online Access: | http://link.springer.com/article/10.1186/s40543-020-00231-9 |
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