Enhanced super-resolution microscopy by extreme value based emitter recovery
Abstract Super-resolution localization microscopy allows visualization of biological structure at nanoscale resolution. However, the presence of heterogeneous background can degrade the nanoscale resolution by tens of nanometers and introduce significant image artifacts. Here we investigate and vali...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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Nature Portfolio
2021-10-01
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| Series: | Scientific Reports |
| Online Access: | https://doi.org/10.1038/s41598-021-00066-3 |
| _version_ | 1818937136394534912 |
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| author | Hongqiang Ma Wei Jiang Jianquan Xu Yang Liu |
| author_facet | Hongqiang Ma Wei Jiang Jianquan Xu Yang Liu |
| author_sort | Hongqiang Ma |
| collection | DOAJ |
| description | Abstract Super-resolution localization microscopy allows visualization of biological structure at nanoscale resolution. However, the presence of heterogeneous background can degrade the nanoscale resolution by tens of nanometers and introduce significant image artifacts. Here we investigate and validate an efficient approach, referred to as extreme value-based emitter recovery (EVER), to accurately recover the distorted fluorescent emitters from heterogeneous background. Through numerical simulation and biological experiments, we validated the accuracy of EVER in improving the fidelity of the reconstructed super-resolution image for a wide variety of imaging characteristics. EVER requires no manual adjustment of parameters and has been implemented as an easy-to-use ImageJ plugin that can immediately enhance the quality of reconstructed super-resolution images. This method is validated as an efficient way for robust nanoscale imaging of samples with heterogeneous background fluorescence, such as thicker tissue and cells. |
| first_indexed | 2024-12-20T05:47:10Z |
| format | Article |
| id | doaj.art-fcbf96dcced647558e1b97effa31cba2 |
| institution | Directory Open Access Journal |
| issn | 2045-2322 |
| language | English |
| last_indexed | 2024-12-20T05:47:10Z |
| publishDate | 2021-10-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Scientific Reports |
| spelling | doaj.art-fcbf96dcced647558e1b97effa31cba22022-12-21T19:51:17ZengNature PortfolioScientific Reports2045-23222021-10-0111111010.1038/s41598-021-00066-3Enhanced super-resolution microscopy by extreme value based emitter recoveryHongqiang Ma0Wei Jiang1Jianquan Xu2Yang Liu3Biomedical and Optical Imaging Laboratory, Deparstments of Medicine and Bioengineering, University of PittsburghBiomedical and Optical Imaging Laboratory, Deparstments of Medicine and Bioengineering, University of PittsburghBiomedical and Optical Imaging Laboratory, Deparstments of Medicine and Bioengineering, University of PittsburghBiomedical and Optical Imaging Laboratory, Deparstments of Medicine and Bioengineering, University of PittsburghAbstract Super-resolution localization microscopy allows visualization of biological structure at nanoscale resolution. However, the presence of heterogeneous background can degrade the nanoscale resolution by tens of nanometers and introduce significant image artifacts. Here we investigate and validate an efficient approach, referred to as extreme value-based emitter recovery (EVER), to accurately recover the distorted fluorescent emitters from heterogeneous background. Through numerical simulation and biological experiments, we validated the accuracy of EVER in improving the fidelity of the reconstructed super-resolution image for a wide variety of imaging characteristics. EVER requires no manual adjustment of parameters and has been implemented as an easy-to-use ImageJ plugin that can immediately enhance the quality of reconstructed super-resolution images. This method is validated as an efficient way for robust nanoscale imaging of samples with heterogeneous background fluorescence, such as thicker tissue and cells.https://doi.org/10.1038/s41598-021-00066-3 |
| spellingShingle | Hongqiang Ma Wei Jiang Jianquan Xu Yang Liu Enhanced super-resolution microscopy by extreme value based emitter recovery Scientific Reports |
| title | Enhanced super-resolution microscopy by extreme value based emitter recovery |
| title_full | Enhanced super-resolution microscopy by extreme value based emitter recovery |
| title_fullStr | Enhanced super-resolution microscopy by extreme value based emitter recovery |
| title_full_unstemmed | Enhanced super-resolution microscopy by extreme value based emitter recovery |
| title_short | Enhanced super-resolution microscopy by extreme value based emitter recovery |
| title_sort | enhanced super resolution microscopy by extreme value based emitter recovery |
| url | https://doi.org/10.1038/s41598-021-00066-3 |
| work_keys_str_mv | AT hongqiangma enhancedsuperresolutionmicroscopybyextremevaluebasedemitterrecovery AT weijiang enhancedsuperresolutionmicroscopybyextremevaluebasedemitterrecovery AT jianquanxu enhancedsuperresolutionmicroscopybyextremevaluebasedemitterrecovery AT yangliu enhancedsuperresolutionmicroscopybyextremevaluebasedemitterrecovery |