First principles analysis on the stability of C, Sn atoms near the surface of Ge thin film

To apply the germanium (Ge) thin film for various electronic devices, energy band structure should be controlled by carbon (C) and/or Tin (Sn) doping. It is important to understand the stable atomic configurations of C and Sn atoms near the (001) surface of a Ge thin film. In this study, first princ...

Full description

Bibliographic Details
Main Authors: Kai TADANO, Koji SUEOKA
Format: Article
Language:Japanese
Published: The Japan Society of Mechanical Engineers 2018-02-01
Series:Nihon Kikai Gakkai ronbunshu
Subjects:
Online Access:https://www.jstage.jst.go.jp/article/transjsme/84/858/84_17-00542/_pdf/-char/en
_version_ 1811221130190520320
author Kai TADANO
Koji SUEOKA
author_facet Kai TADANO
Koji SUEOKA
author_sort Kai TADANO
collection DOAJ
description To apply the germanium (Ge) thin film for various electronic devices, energy band structure should be controlled by carbon (C) and/or Tin (Sn) doping. It is important to understand the stable atomic configurations of C and Sn atoms near the (001) surface of a Ge thin film. In this study, first principles calculation based on density functional theory was performed to obtain the formation energies and the thermal equilibrium concentrations of C and Sn atoms near the surface of Ge thin film. The results of the analysis are threefold. First, C and Sn atoms are most stable at the first atomic layer of the Ge thin film, and the surface does not affect the stability of C or Sn atoms deeper than the fifth layer. Second, C and Sn atoms at the second to fourth layer increase the thermal equilibrium concentration of newly arrived C and Sn atoms at the surface during film growth. Third, in the case of mono-doping, formation energy of C (Sn) at the (001) surface increases with increasing concentration of surface C (Sn). In the case of co-doping at C/Sn concentration ratio of 1:1, the increases of formation energies are suppressed in comparison to the case of mono-doping. It is concluded from these results that co-doping enhances the incorporation of C and Sn atoms in the Ge thin film. Furthermore, the doped atom near Si surface becomes more stable than that in the Si bulk, and it is more remarkable in comparison to Ge.
first_indexed 2024-04-12T07:53:59Z
format Article
id doaj.art-fdd32e36d9ea46528f1cd0811de19e03
institution Directory Open Access Journal
issn 2187-9761
language Japanese
last_indexed 2024-04-12T07:53:59Z
publishDate 2018-02-01
publisher The Japan Society of Mechanical Engineers
record_format Article
series Nihon Kikai Gakkai ronbunshu
spelling doaj.art-fdd32e36d9ea46528f1cd0811de19e032022-12-22T03:41:32ZjpnThe Japan Society of Mechanical EngineersNihon Kikai Gakkai ronbunshu2187-97612018-02-018485817-0054217-0054210.1299/transjsme.17-00542transjsmeFirst principles analysis on the stability of C, Sn atoms near the surface of Ge thin filmKai TADANO0Koji SUEOKA1Department of Communication Engineering, Okayama Prefectural UniversityDepartment of Communication Engineering, Okayama Prefectural UniversityTo apply the germanium (Ge) thin film for various electronic devices, energy band structure should be controlled by carbon (C) and/or Tin (Sn) doping. It is important to understand the stable atomic configurations of C and Sn atoms near the (001) surface of a Ge thin film. In this study, first principles calculation based on density functional theory was performed to obtain the formation energies and the thermal equilibrium concentrations of C and Sn atoms near the surface of Ge thin film. The results of the analysis are threefold. First, C and Sn atoms are most stable at the first atomic layer of the Ge thin film, and the surface does not affect the stability of C or Sn atoms deeper than the fifth layer. Second, C and Sn atoms at the second to fourth layer increase the thermal equilibrium concentration of newly arrived C and Sn atoms at the surface during film growth. Third, in the case of mono-doping, formation energy of C (Sn) at the (001) surface increases with increasing concentration of surface C (Sn). In the case of co-doping at C/Sn concentration ratio of 1:1, the increases of formation energies are suppressed in comparison to the case of mono-doping. It is concluded from these results that co-doping enhances the incorporation of C and Sn atoms in the Ge thin film. Furthermore, the doped atom near Si surface becomes more stable than that in the Si bulk, and it is more remarkable in comparison to Ge.https://www.jstage.jst.go.jp/article/transjsme/84/858/84_17-00542/_pdf/-char/engesithin filmatomic configurationfirst principles calculation
spellingShingle Kai TADANO
Koji SUEOKA
First principles analysis on the stability of C, Sn atoms near the surface of Ge thin film
Nihon Kikai Gakkai ronbunshu
ge
si
thin film
atomic configuration
first principles calculation
title First principles analysis on the stability of C, Sn atoms near the surface of Ge thin film
title_full First principles analysis on the stability of C, Sn atoms near the surface of Ge thin film
title_fullStr First principles analysis on the stability of C, Sn atoms near the surface of Ge thin film
title_full_unstemmed First principles analysis on the stability of C, Sn atoms near the surface of Ge thin film
title_short First principles analysis on the stability of C, Sn atoms near the surface of Ge thin film
title_sort first principles analysis on the stability of c sn atoms near the surface of ge thin film
topic ge
si
thin film
atomic configuration
first principles calculation
url https://www.jstage.jst.go.jp/article/transjsme/84/858/84_17-00542/_pdf/-char/en
work_keys_str_mv AT kaitadano firstprinciplesanalysisonthestabilityofcsnatomsnearthesurfaceofgethinfilm
AT kojisueoka firstprinciplesanalysisonthestabilityofcsnatomsnearthesurfaceofgethinfilm