Shot noise limited soft x-ray absorption spectroscopy in solution at a SASE-FEL using a transmission grating beam splitter
X-ray absorption near-edge structure (XANES) spectroscopy provides element specificity and is a powerful experimental method to probe local unoccupied electronic structures. In the soft x-ray regime, it is especially well suited for the study of 3d-metals and light elements such as nitrogen. Recent...
Main Authors: | , , , , , , , , , , , , , , , , , , , |
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Format: | Article |
Language: | English |
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AIP Publishing LLC and ACA
2021-01-01
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Series: | Structural Dynamics |
Online Access: | http://dx.doi.org/10.1063/4.0000049 |
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author | Robin Y. Engel Maria Ekimova Piter S. Miedema Carlo Kleine Jan Ludwig Miguel Ochmann Benjamin Grimm-Lebsanft Rory Ma Melissa Teubner Siarhei Dziarzhytski Günter Brenner Marie Kristin Czwalinna Benedikt Rösner Tae Kyu Kim Christian David Sonja Herres-Pawlis Michael Rübhausen Erik T. J. Nibbering Nils Huse Martin Beye |
author_facet | Robin Y. Engel Maria Ekimova Piter S. Miedema Carlo Kleine Jan Ludwig Miguel Ochmann Benjamin Grimm-Lebsanft Rory Ma Melissa Teubner Siarhei Dziarzhytski Günter Brenner Marie Kristin Czwalinna Benedikt Rösner Tae Kyu Kim Christian David Sonja Herres-Pawlis Michael Rübhausen Erik T. J. Nibbering Nils Huse Martin Beye |
author_sort | Robin Y. Engel |
collection | DOAJ |
description | X-ray absorption near-edge structure (XANES) spectroscopy provides element specificity and is a powerful experimental method to probe local unoccupied electronic structures. In the soft x-ray regime, it is especially well suited for the study of 3d-metals and light elements such as nitrogen. Recent developments in vacuum-compatible liquid flat jets have facilitated soft x-ray transmission spectroscopy on molecules in solution, providing information on valence charge distributions of heteroatoms and metal centers. Here, we demonstrate XANES spectroscopy of molecules in solution at the nitrogen K-edge, performed at FLASH, the Free-Electron Laser (FEL) in Hamburg. A split-beam referencing scheme optimally characterizes the strong shot-to-shot fluctuations intrinsic to the process of self-amplified spontaneous emission on which most FELs are based. Due to this normalization, a sensitivity of 1% relative transmission change is achieved, limited by fundamental photon shot noise. The effective FEL bandwidth is increased by streaking the electron energy over the FEL pulse train to measure a wider spectral window without changing FEL parameters. We propose modifications to the experimental setup with the potential of improving the instrument sensitivity by two orders of magnitude, thereby exploiting the high peak fluence of FELs to enable unprecedented sensitivity for femtosecond XANES spectroscopy on liquids in the soft x-ray spectral region. |
first_indexed | 2024-12-16T18:48:31Z |
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institution | Directory Open Access Journal |
issn | 2329-7778 |
language | English |
last_indexed | 2024-12-16T18:48:31Z |
publishDate | 2021-01-01 |
publisher | AIP Publishing LLC and ACA |
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series | Structural Dynamics |
spelling | doaj.art-feb3d739ad9947ce97291365377f194f2022-12-21T22:20:45ZengAIP Publishing LLC and ACAStructural Dynamics2329-77782021-01-0181014303014303-710.1063/4.0000049Shot noise limited soft x-ray absorption spectroscopy in solution at a SASE-FEL using a transmission grating beam splitterRobin Y. Engel0Maria Ekimova1Piter S. Miedema2Carlo Kleine3Jan Ludwig4Miguel Ochmann5Benjamin Grimm-Lebsanft6Rory Ma7Melissa Teubner8Siarhei Dziarzhytski9Günter Brenner10Marie Kristin Czwalinna11Benedikt Rösner12Tae Kyu Kim13Christian David14Sonja Herres-Pawlis15Michael Rübhausen16Erik T. J. Nibbering17Nils Huse18Martin Beye19 Deutsches Elektronen Synchrotron DESY, 22607 Hamburg, Germany Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany Deutsches Elektronen Synchrotron DESY, 22607 Hamburg, Germany Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany Institut for Nanostructure and Solid-State Physics, CFEL, University of Hamburg, 22761 Hamburg, Germany Institut for Nanostructure and Solid-State Physics, CFEL, University of Hamburg, 22761 Hamburg, Germany Institut for Nanostructure and Solid-State Physics, CFEL, University of Hamburg, 22761 Hamburg, Germany Institut for Nanostructure and Solid-State Physics, CFEL, University of Hamburg, 22761 Hamburg, Germany Deutsches Elektronen Synchrotron DESY, 22607 Hamburg, Germany Deutsches Elektronen Synchrotron DESY, 22607 Hamburg, Germany Deutsches Elektronen Synchrotron DESY, 22607 Hamburg, Germany Paul Scherrer Institute, 5232 Villigen PSI, Switzerland Department of Chemistry, Yonsei University, 03722 Seoul, South Korea Paul Scherrer Institute, 5232 Villigen PSI, Switzerland Institute of Inorganic Chemistry, RWTH Aachen University, 52074 Aachen, Germany Institut for Nanostructure and Solid-State Physics, CFEL, University of Hamburg, 22761 Hamburg, Germany Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany Institut for Nanostructure and Solid-State Physics, CFEL, University of Hamburg, 22761 Hamburg, Germany Deutsches Elektronen Synchrotron DESY, 22607 Hamburg, GermanyX-ray absorption near-edge structure (XANES) spectroscopy provides element specificity and is a powerful experimental method to probe local unoccupied electronic structures. In the soft x-ray regime, it is especially well suited for the study of 3d-metals and light elements such as nitrogen. Recent developments in vacuum-compatible liquid flat jets have facilitated soft x-ray transmission spectroscopy on molecules in solution, providing information on valence charge distributions of heteroatoms and metal centers. Here, we demonstrate XANES spectroscopy of molecules in solution at the nitrogen K-edge, performed at FLASH, the Free-Electron Laser (FEL) in Hamburg. A split-beam referencing scheme optimally characterizes the strong shot-to-shot fluctuations intrinsic to the process of self-amplified spontaneous emission on which most FELs are based. Due to this normalization, a sensitivity of 1% relative transmission change is achieved, limited by fundamental photon shot noise. The effective FEL bandwidth is increased by streaking the electron energy over the FEL pulse train to measure a wider spectral window without changing FEL parameters. We propose modifications to the experimental setup with the potential of improving the instrument sensitivity by two orders of magnitude, thereby exploiting the high peak fluence of FELs to enable unprecedented sensitivity for femtosecond XANES spectroscopy on liquids in the soft x-ray spectral region.http://dx.doi.org/10.1063/4.0000049 |
spellingShingle | Robin Y. Engel Maria Ekimova Piter S. Miedema Carlo Kleine Jan Ludwig Miguel Ochmann Benjamin Grimm-Lebsanft Rory Ma Melissa Teubner Siarhei Dziarzhytski Günter Brenner Marie Kristin Czwalinna Benedikt Rösner Tae Kyu Kim Christian David Sonja Herres-Pawlis Michael Rübhausen Erik T. J. Nibbering Nils Huse Martin Beye Shot noise limited soft x-ray absorption spectroscopy in solution at a SASE-FEL using a transmission grating beam splitter Structural Dynamics |
title | Shot noise limited soft x-ray absorption spectroscopy in solution at a SASE-FEL using a transmission grating beam splitter |
title_full | Shot noise limited soft x-ray absorption spectroscopy in solution at a SASE-FEL using a transmission grating beam splitter |
title_fullStr | Shot noise limited soft x-ray absorption spectroscopy in solution at a SASE-FEL using a transmission grating beam splitter |
title_full_unstemmed | Shot noise limited soft x-ray absorption spectroscopy in solution at a SASE-FEL using a transmission grating beam splitter |
title_short | Shot noise limited soft x-ray absorption spectroscopy in solution at a SASE-FEL using a transmission grating beam splitter |
title_sort | shot noise limited soft x ray absorption spectroscopy in solution at a sase fel using a transmission grating beam splitter |
url | http://dx.doi.org/10.1063/4.0000049 |
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