Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer

Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer

In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem t...

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Bibliographic Details
Main Authors: Tinglu Song, Meishuai Zou, Defeng Lu, Hanyuan Chen, Benpeng Wang, Shuo Wang, Fan Xu
Format: Article
Language:English
Published: MDPI AG 2021-11-01
Series:Crystals
Subjects:
ToF-SIMS
alloy
component distribution
crystal orientation
2D mapping image
Online Access:https://www.mdpi.com/2073-4352/11/12/1465

Internet

https://www.mdpi.com/2073-4352/11/12/1465

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