Investigation of the Optical Properties of Silicon-on-Insulator Microring Resonators Using Optical Backscatter Reflectometry

Investigation of the Optical Properties of Silicon-on-Insulator Microring Resonators Using Optical Backscatter Reflectometry

Introduction. Optical backscatter reflectometry is one of the most promising methods used to examine characteristic parameters relevant to the design of microring resonators. This method paves the way for experimental determination of the coupling coefficient and propagation loss. However, experimen...

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Bibliographic Details
Main Authors: I. A. Ryabcev, A. A. Ershov, D. V. Ryaikkenen, A. P. Burovikhin, R. V. Haponchyk, I. Yu. Tatsenko, A. A. Stashkevich, A. A. Nikitin, A. B. Ustinov
Format: Article
Language:Russian
Published: Saint Petersburg Electrotechnical University "LETI" 2022-12-01
Series:Известия высших учебных заведений России: Радиоэлектроника
Subjects:
микрокольцевой резонатор
рефлектометрия обратного рассеяния
кремний на изоляторе
Online Access:https://re.eltech.ru/jour/article/view/697

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