Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy
Scanning tunneling microscopy (STM) can image material surfaces with atomic resolution, making it a useful tool in the areas of physics and materials. Many materials are synthesized at micron size, especially few-layer materials. Limited by their complex structure, very few STMs are capable of direc...
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| Format: | Article |
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MDPI AG
2023-01-01
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| Series: | Micromachines |
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| Online Access: | https://www.mdpi.com/2072-666X/14/2/287 |
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| author | Weixuan Li Jihao Wang Jing Zhang Wenjie Meng Caihong Xie Yubin Hou Zhigang Xia Qingyou Lu |
| author_facet | Weixuan Li Jihao Wang Jing Zhang Wenjie Meng Caihong Xie Yubin Hou Zhigang Xia Qingyou Lu |
| author_sort | Weixuan Li |
| collection | DOAJ |
| description | Scanning tunneling microscopy (STM) can image material surfaces with atomic resolution, making it a useful tool in the areas of physics and materials. Many materials are synthesized at micron size, especially few-layer materials. Limited by their complex structure, very few STMs are capable of directly positioning and imaging a micron-sized sample with atomic resolution. Traditional STMs are designed to study the material behavior induced by temperature variation, while the physical properties induced by magnetic fields are rarely studied. In this paper, we present the design and construction of an atomic-resolution STM that can operate in a 9 T high magnetic field. More importantly, the homebuilt STM is capable of imaging micron-sized samples. The performance of the STM is demonstrated by high-quality atomic images obtained on a graphite surface, with low drift rates in the X–Y plane and Z direction. The atomic-resolution image obtained on a 32-μm graphite flake illustrates the new STM’s ability of positioning and imaging micron-sized samples. Finally, we present atomic resolution images at a magnetic field range from 0 T to 9 T. The above advantages make our STM a promising tool for investigating the quantum hall effect of micron-sized layered materials. |
| first_indexed | 2024-03-11T08:25:50Z |
| format | Article |
| id | doaj.art-ff90595dcd464b26ad6b1fc65f2a2b7c |
| institution | Directory Open Access Journal |
| issn | 2072-666X |
| language | English |
| last_indexed | 2024-03-11T08:25:50Z |
| publishDate | 2023-01-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Micromachines |
| spelling | doaj.art-ff90595dcd464b26ad6b1fc65f2a2b7c2023-11-16T22:10:06ZengMDPI AGMicromachines2072-666X2023-01-0114228710.3390/mi14020287Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling MicroscopyWeixuan Li0Jihao Wang1Jing Zhang2Wenjie Meng3Caihong Xie4Yubin Hou5Zhigang Xia6Qingyou Lu7College of Metrology and Measurement Engineering, China Jiliang University (CJLU), Hangzhou 310018, ChinaAnhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, ChinaAnhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, ChinaAnhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, ChinaAnhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, ChinaAnhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, ChinaCollege of Metrology and Measurement Engineering, China Jiliang University (CJLU), Hangzhou 310018, ChinaAnhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, ChinaScanning tunneling microscopy (STM) can image material surfaces with atomic resolution, making it a useful tool in the areas of physics and materials. Many materials are synthesized at micron size, especially few-layer materials. Limited by their complex structure, very few STMs are capable of directly positioning and imaging a micron-sized sample with atomic resolution. Traditional STMs are designed to study the material behavior induced by temperature variation, while the physical properties induced by magnetic fields are rarely studied. In this paper, we present the design and construction of an atomic-resolution STM that can operate in a 9 T high magnetic field. More importantly, the homebuilt STM is capable of imaging micron-sized samples. The performance of the STM is demonstrated by high-quality atomic images obtained on a graphite surface, with low drift rates in the X–Y plane and Z direction. The atomic-resolution image obtained on a 32-μm graphite flake illustrates the new STM’s ability of positioning and imaging micron-sized samples. Finally, we present atomic resolution images at a magnetic field range from 0 T to 9 T. The above advantages make our STM a promising tool for investigating the quantum hall effect of micron-sized layered materials.https://www.mdpi.com/2072-666X/14/2/287Scanning tunneling microscopyhigh magnetic fieldmicron-sized sample |
| spellingShingle | Weixuan Li Jihao Wang Jing Zhang Wenjie Meng Caihong Xie Yubin Hou Zhigang Xia Qingyou Lu Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy Micromachines Scanning tunneling microscopy high magnetic field micron-sized sample |
| title | Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy |
| title_full | Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy |
| title_fullStr | Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy |
| title_full_unstemmed | Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy |
| title_short | Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy |
| title_sort | atomic resolution imaging of micron sized samples realized by high magnetic field scanning tunneling microscopy |
| topic | Scanning tunneling microscopy high magnetic field micron-sized sample |
| url | https://www.mdpi.com/2072-666X/14/2/287 |
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