Maximum-likelihood decoding of device-specific multi-bit symbols for reliable key generation

We present a PUF key generation scheme that uses the provably optimal method of maximum-likelihood (ML) detection on symbols derived from PUF response bits. Each device forms a noisy, device-specific symbol constellation, based on manufacturing variation. Each detected symbol is a letter in a codewo...

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Bibliographic Details
Main Authors: Yu, Meng-Day, Hiller, Matthias, Devadas, Srinivas
Other Authors: Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers (IEEE) 2015
Online Access:http://hdl.handle.net/1721.1/100010
https://orcid.org/0000-0001-8253-7714