Growth of amorphous tungsten silicide and study of the proximity effect at low dimensions for superconducting applications
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015.
Main Author: | Surick, Jonathan Jacob |
---|---|
Other Authors: | Karl K. Berggren. |
Format: | Thesis |
Language: | eng |
Published: |
Massachusetts Institute of Technology
2016
|
Subjects: | |
Online Access: | http://hdl.handle.net/1721.1/100622 |
Similar Items
-
Single-photon detection in the mid-infrared up to 10 μ m wavelength using tungsten silicide superconducting nanowire detectors
by: Verma, VB, et al.
Published: (2022) -
Emergent superconductivity in low dimensions
by: Ansermet, Diane
Published: (2018) -
Controlled and explosive silicidation of metal/amorphous-silicon multilayer thin films
by: Clevenger, Lawrence Alfred
Published: (2005) -
Physical properties of amorphous molybdenum silicide films for single-photon detectors
by: Zhang, Xiaofu, et al.
Published: (2022) -
Improved electrical performance of Erbium silicide Schottky diodes formed by pre-RTA amorphization of Si
by: Tang, L. J., et al.
Published: (2012)