Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling
X-ray photoelectron spectroscopy (XPS) depth profiling with C[+ over 60] sputtering was used to resolve the lithium-ion distribution in the nanometer-scale domain structures of block polymer electrolyte thin films. The electrolytes of interest are mixtures of lithium trifluoromethanesulfonate and la...
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American Chemical Society (ACS)
2016
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Online Access: | http://hdl.handle.net/1721.1/101167 https://orcid.org/0000-0003-3570-8917 https://orcid.org/0000-0003-1085-7692 |
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author | Gilbert, Jonathan B. Luo, Ming Shelton, Cameron K. Rubner, Michael F. Cohen, Robert E. Epps, Thomas H. |
author2 | Massachusetts Institute of Technology. Center for Materials Science and Engineering |
author_facet | Massachusetts Institute of Technology. Center for Materials Science and Engineering Gilbert, Jonathan B. Luo, Ming Shelton, Cameron K. Rubner, Michael F. Cohen, Robert E. Epps, Thomas H. |
author_sort | Gilbert, Jonathan B. |
collection | MIT |
description | X-ray photoelectron spectroscopy (XPS) depth profiling with C[+ over 60] sputtering was used to resolve the lithium-ion distribution in the nanometer-scale domain structures of block polymer electrolyte thin films. The electrolytes of interest are mixtures of lithium trifluoromethanesulfonate and lamellar-forming polystyrene–poly(oligo(oxyethylene)methacrylate) (PS–POEM) copolymer. XPS depth profiling results showed that the lithium-ion concentration was directly correlated with the POEM concentration. Furthermore, chemical state and atomic composition of the film were analyzed through the deconvolution of the C1s signal, indicating that the lithium ions appear to be uniformly distributed in the POEM domains. Overall, the unique capabilities of C[+ over 60] depth profiling XPS provide a powerful tool for the analysis of nanostructured polymer thin films in applications ranging from energy storage and generation to surface coatings and nanoscale templates. |
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institution | Massachusetts Institute of Technology |
language | en_US |
last_indexed | 2024-09-23T14:20:25Z |
publishDate | 2016 |
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spelling | mit-1721.1/1011672022-10-01T20:42:32Z Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling Gilbert, Jonathan B. Luo, Ming Shelton, Cameron K. Rubner, Michael F. Cohen, Robert E. Epps, Thomas H. Massachusetts Institute of Technology. Center for Materials Science and Engineering Massachusetts Institute of Technology. Department of Chemical Engineering Massachusetts Institute of Technology. Department of Materials Science and Engineering Gilbert, Jonathan B. Rubner, Michael F. Cohen, Robert E. X-ray photoelectron spectroscopy (XPS) depth profiling with C[+ over 60] sputtering was used to resolve the lithium-ion distribution in the nanometer-scale domain structures of block polymer electrolyte thin films. The electrolytes of interest are mixtures of lithium trifluoromethanesulfonate and lamellar-forming polystyrene–poly(oligo(oxyethylene)methacrylate) (PS–POEM) copolymer. XPS depth profiling results showed that the lithium-ion concentration was directly correlated with the POEM concentration. Furthermore, chemical state and atomic composition of the film were analyzed through the deconvolution of the C1s signal, indicating that the lithium ions appear to be uniformly distributed in the POEM domains. Overall, the unique capabilities of C[+ over 60] depth profiling XPS provide a powerful tool for the analysis of nanostructured polymer thin films in applications ranging from energy storage and generation to surface coatings and nanoscale templates. National Science Foundation (U.S.). Materials Research Science and Engineering Centers (Program) (Award DMR-0819762) National Science Foundation (U.S.). Graduate Research Fellowship American Society for Engineering Education. National Defense Science and Engineering Graduate Fellowship 2016-02-12T16:36:14Z 2016-02-12T16:36:14Z 2014-12 2014-10 Article http://purl.org/eprint/type/JournalArticle 1936-0851 1936-086X http://hdl.handle.net/1721.1/101167 Gilbert, Jonathan B., Ming Luo, Cameron K. Shelton, Michael F. Rubner, Robert E. Cohen, and Thomas H. Epps. “Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-Ray Photoelectron Spectroscopy Depth Profiling.” ACS Nano 9, no. 1 (January 27, 2015): 512–20. © 2014 American Chemical Society https://orcid.org/0000-0003-3570-8917 https://orcid.org/0000-0003-1085-7692 en_US http://dx.doi.org/10.1021/nn505744r ACS Nano Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Chemical Society (ACS) ACS |
spellingShingle | Gilbert, Jonathan B. Luo, Ming Shelton, Cameron K. Rubner, Michael F. Cohen, Robert E. Epps, Thomas H. Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling |
title | Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling |
title_full | Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling |
title_fullStr | Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling |
title_full_unstemmed | Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling |
title_short | Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling |
title_sort | determination of lithium ion distributions in nanostructured block polymer electrolyte thin films by x ray photoelectron spectroscopy depth profiling |
url | http://hdl.handle.net/1721.1/101167 https://orcid.org/0000-0003-3570-8917 https://orcid.org/0000-0003-1085-7692 |
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