Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2]
We report highly efficient nonradiative energy transfer from cadmium selenide (CdSe) quantum dots to monolayer and few-layer molybdenum disulfide (MoS[subscript 2]). The quenching of the donor quantum dot photoluminescence increases as the MoS[subscript 2] flake thickness decreases with the highest...
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| Format: | Article |
| Language: | en_US |
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American Chemical Society (ACS)
2016
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| Online Access: | http://hdl.handle.net/1721.1/101378 https://orcid.org/0000-0002-6615-5342 https://orcid.org/0000-0002-0159-5646 |
| _version_ | 1811071143880163328 |
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| author | Prins, Ferry Tisdale, William A. Goodman, Aaron Jacob |
| author2 | Massachusetts Institute of Technology. Department of Chemical Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Chemical Engineering Prins, Ferry Tisdale, William A. Goodman, Aaron Jacob |
| author_sort | Prins, Ferry |
| collection | MIT |
| description | We report highly efficient nonradiative energy transfer from cadmium selenide (CdSe) quantum dots to monolayer and few-layer molybdenum disulfide (MoS[subscript 2]). The quenching of the donor quantum dot photoluminescence increases as the MoS[subscript 2] flake thickness decreases with the highest efficiency (>95%) observed for monolayer MoS[subscript 2]. This counterintuitive result arises from reduced dielectric screening in thin layer semiconductors having unusually large permittivity and a strong in-plane transition dipole moment, as found in MoS[subscript 2]. Excitonic energy transfer between a zero-dimensional emitter and a two-dimensional absorber is fundamentally interesting and enables a wide range of applications including broadband optical down-conversion, optical detection, photovoltaic sensitization, and color shifting in light-emitting devices. |
| first_indexed | 2024-09-23T08:46:42Z |
| format | Article |
| id | mit-1721.1/101378 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T08:46:42Z |
| publishDate | 2016 |
| publisher | American Chemical Society (ACS) |
| record_format | dspace |
| spelling | mit-1721.1/1013782022-09-30T11:14:14Z Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2] Prins, Ferry Tisdale, William A. Goodman, Aaron Jacob Massachusetts Institute of Technology. Department of Chemical Engineering Massachusetts Institute of Technology. Department of Chemistry Massachusetts Institute of Technology. Research Laboratory of Electronics Prins, Ferry Goodman, Aaron Jacob Tisdale, William A. We report highly efficient nonradiative energy transfer from cadmium selenide (CdSe) quantum dots to monolayer and few-layer molybdenum disulfide (MoS[subscript 2]). The quenching of the donor quantum dot photoluminescence increases as the MoS[subscript 2] flake thickness decreases with the highest efficiency (>95%) observed for monolayer MoS[subscript 2]. This counterintuitive result arises from reduced dielectric screening in thin layer semiconductors having unusually large permittivity and a strong in-plane transition dipole moment, as found in MoS[subscript 2]. Excitonic energy transfer between a zero-dimensional emitter and a two-dimensional absorber is fundamentally interesting and enables a wide range of applications including broadband optical down-conversion, optical detection, photovoltaic sensitization, and color shifting in light-emitting devices. United States. Dept. of Energy. Office of Basic Energy Sciences (Award DE-SC0001088) 2016-02-29T17:45:38Z 2016-02-29T17:45:38Z 2014-10 2014-09 Article http://purl.org/eprint/type/JournalArticle 1530-6984 1530-6992 http://hdl.handle.net/1721.1/101378 Prins, Ferry, Aaron J. Goodman, and William A. Tisdale. “Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2].” Nano Lett. 14, no. 11 (November 12, 2014): 6087–6091. https://orcid.org/0000-0002-6615-5342 https://orcid.org/0000-0002-0159-5646 en_US http://dx.doi.org/10.1021/nl5019386 Nano Letters Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Chemical Society (ACS) arXiv |
| spellingShingle | Prins, Ferry Tisdale, William A. Goodman, Aaron Jacob Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2] |
| title | Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2] |
| title_full | Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2] |
| title_fullStr | Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2] |
| title_full_unstemmed | Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2] |
| title_short | Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2] |
| title_sort | reduced dielectric screening and enhanced energy transfer in single and few layer mos subscript 2 |
| url | http://hdl.handle.net/1721.1/101378 https://orcid.org/0000-0002-6615-5342 https://orcid.org/0000-0002-0159-5646 |
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