Physical redundancy for defect tolerance : example designs and fundamental limits

Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015.

Bibliographic Details
Main Author: Tang, Jennifer (Jennifer Susan)
Other Authors: Yury Polyanskiy.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2016
Subjects:
Online Access:http://hdl.handle.net/1721.1/101588

Similar Items