The effects of grain structure and Cu distribution on the relability of near-bamboo Al-Cu alloy interconnects

The effects of grain structure and Cu distribution on the relability of near-bamboo Al-Cu alloy interconnects

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1997.

Bibliographic Details
Main Author: Knowlton, Brett D. (Brett Douglas)
Other Authors: Carl V. Thompson.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Materials Science and Engineering
Online Access:http://hdl.handle.net/1721.1/10379

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