Interpreting Tests of School VAM Validity

We develop over-identification tests that use admissions lotteries to assess the predictive value of regression-based value-added models (VAMs). These tests have degrees of freedom equal to the number of quasi-experiments available to estimate school effects. By contrast, previously implemented VAM...

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Main Authors: Walters, Christopher, Angrist, Joshua, Hull, Peter Davenport, Pathak, Parag
Other Authors: Massachusetts Institute of Technology. Department of Economics
Format: Article
Language:en_US
Published: American Economic Association (AEA) 2016
Online Access:http://hdl.handle.net/1721.1/104953
https://orcid.org/0000-0001-6992-8956
https://orcid.org/0000-0003-3910-1573
https://orcid.org/0000-0001-8621-3864
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author Walters, Christopher
Angrist, Joshua
Hull, Peter Davenport
Pathak, Parag
author2 Massachusetts Institute of Technology. Department of Economics
author_facet Massachusetts Institute of Technology. Department of Economics
Walters, Christopher
Angrist, Joshua
Hull, Peter Davenport
Pathak, Parag
author_sort Walters, Christopher
collection MIT
description We develop over-identification tests that use admissions lotteries to assess the predictive value of regression-based value-added models (VAMs). These tests have degrees of freedom equal to the number of quasi-experiments available to estimate school effects. By contrast, previously implemented VAM validation strategies look at a single restriction only, sometimes said to measure forecast bias. Tests of forecast bias may be misleading when the test statistic is constructed from many lotteries or quasi-experiments, some of which have weak first stage effects on school attendance. The theory developed here is applied to data from the Charlotte-Mecklenberg School district analyzed by Deming (2014).
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spelling mit-1721.1/1049532022-10-01T16:01:44Z Interpreting Tests of School VAM Validity Walters, Christopher Angrist, Joshua Hull, Peter Davenport Pathak, Parag Massachusetts Institute of Technology. Department of Economics Angrist, Joshua Hull, Peter Davenport Pathak, Parag We develop over-identification tests that use admissions lotteries to assess the predictive value of regression-based value-added models (VAMs). These tests have degrees of freedom equal to the number of quasi-experiments available to estimate school effects. By contrast, previously implemented VAM validation strategies look at a single restriction only, sometimes said to measure forecast bias. Tests of forecast bias may be misleading when the test statistic is constructed from many lotteries or quasi-experiments, some of which have weak first stage effects on school attendance. The theory developed here is applied to data from the Charlotte-Mecklenberg School district analyzed by Deming (2014). National Science Foundation (U.S.) Laura and John Arnold Foundation Spencer Foundation 2016-10-24T19:05:33Z 2016-10-24T19:05:33Z 2016-05 Article http://purl.org/eprint/type/JournalArticle 0002-8282 1944-7981 http://hdl.handle.net/1721.1/104953 Angrist, Joshua, Peter Hull, Parag Pathak, and Christopher Walters. “Interpreting Tests of School VAM Validity.” American Economic Review 106, no. 5 (May 2016): 388–392. ©2016 American Economic Association. https://orcid.org/0000-0001-6992-8956 https://orcid.org/0000-0003-3910-1573 https://orcid.org/0000-0001-8621-3864 en_US http://dx.doi.org/10.1257/aer.p20161080 American Economic Review Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Economic Association (AEA) American Economic Association
spellingShingle Walters, Christopher
Angrist, Joshua
Hull, Peter Davenport
Pathak, Parag
Interpreting Tests of School VAM Validity
title Interpreting Tests of School VAM Validity
title_full Interpreting Tests of School VAM Validity
title_fullStr Interpreting Tests of School VAM Validity
title_full_unstemmed Interpreting Tests of School VAM Validity
title_short Interpreting Tests of School VAM Validity
title_sort interpreting tests of school vam validity
url http://hdl.handle.net/1721.1/104953
https://orcid.org/0000-0001-6992-8956
https://orcid.org/0000-0003-3910-1573
https://orcid.org/0000-0001-8621-3864
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