Detection of liquid–vapor–solid triple contact line in two-phase heat transfer phenomena using high-speed infrared thermometry

Heat transfer in complex physical situations such as nucleate boiling, quenching and dropwise condensation is strongly affected by the presence of a liquid–vapor–solid triple contact line, where intense energy transfer and phase change occur. A novel experimental technique for the detection of the l...

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書目詳細資料
Main Authors: Buongiorno, Jacopo, Kim, Hyungdae
其他作者: Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
格式: Article
語言:en_US
出版: Elsevier 2016
在線閱讀:http://hdl.handle.net/1721.1/105170
實物特徵
總結:Heat transfer in complex physical situations such as nucleate boiling, quenching and dropwise condensation is strongly affected by the presence of a liquid–vapor–solid triple contact line, where intense energy transfer and phase change occur. A novel experimental technique for the detection of the liquid–vapor–solid line in these situations is presented. The technique is based on high-speed infrared (IR) thermometry through an IR-transparent silicon wafer heater; hence the name DEPIcT, or DEtection of Phase by Infrared Thermometry. Where the heater surface is wet, the IR camera measures the temperature of the hot water in contact with the heater. On the other hand, where vapor (whose IR absorptivity is very low) is in contact with the heater, the IR light comes from the cooler water beyond the vapor. The resulting IR image appears dark (cold) in dry spots and bright (hot) in wetted area. Using the contrast between the dark and bright areas, we can visualize the distribution of the liquid and gas phases in contact with the heater surface, and thus identify the liquid–vapor–solid contact line. In other words, we measure temperature beyond the surface to detect phases on the surface. It was shown that even small temperature differences (∼1 °C) can yield a sharp identification of the contact line, within about 100 μm resolution. DEPIcT was also shown to be able to detect thin liquid layers, through the analysis of interference patterns.