Development of a beamline system for characterization of X-ray and neutron optics

Thesis: S.B., Massachusetts Institute of Technology, Department of Physics, 2016.

Bibliographic Details
Main Author: Ames, Andrew O. (Andrew Owen)
Other Authors: Suzanne Romaine and Marshall Bautz.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2016
Subjects:
Online Access:http://hdl.handle.net/1721.1/105627
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author Ames, Andrew O. (Andrew Owen)
author2 Suzanne Romaine and Marshall Bautz.
author_facet Suzanne Romaine and Marshall Bautz.
Ames, Andrew O. (Andrew Owen)
author_sort Ames, Andrew O. (Andrew Owen)
collection MIT
description Thesis: S.B., Massachusetts Institute of Technology, Department of Physics, 2016.
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spelling mit-1721.1/1056272019-04-12T17:45:05Z Development of a beamline system for characterization of X-ray and neutron optics Ames, Andrew O. (Andrew Owen) Suzanne Romaine and Marshall Bautz. Massachusetts Institute of Technology. Department of Physics. Massachusetts Institute of Technology. Department of Physics. Physics. Thesis: S.B., Massachusetts Institute of Technology, Department of Physics, 2016. Cataloged from PDF version of thesis. Includes bibliographical references (pages 69-71). In this thesis, I present a beamline system designed and built at the Harvard-Smithsonian Center for Astrophysics (CfA) to measure the reflectivity and resolution of small diameter multilayer coated Wolter optics. These optics, used for imaging of x-rays and neutrons, have numerous applications in areas such as medicine, fusion research and planetary science. The beamline consists of a divergent x-ray source, an energy sensitive detector, and a set of precise, computer controlled motorized stages for alignment. A dedicated software package was developed to interface with the detector and stages using the Python programming language. The beamline was used to measure the reflectivity and spatial resolution of two x-ray optics recently fabricated at the CfA. These results are presented and compared with theoretical models for reflectivity from a multilayer surface. by Andrew O. Ames. S.B. 2016-12-05T19:55:33Z 2016-12-05T19:55:33Z 2016 2016 Thesis http://hdl.handle.net/1721.1/105627 963177784 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 71 pages application/pdf Massachusetts Institute of Technology
spellingShingle Physics.
Ames, Andrew O. (Andrew Owen)
Development of a beamline system for characterization of X-ray and neutron optics
title Development of a beamline system for characterization of X-ray and neutron optics
title_full Development of a beamline system for characterization of X-ray and neutron optics
title_fullStr Development of a beamline system for characterization of X-ray and neutron optics
title_full_unstemmed Development of a beamline system for characterization of X-ray and neutron optics
title_short Development of a beamline system for characterization of X-ray and neutron optics
title_sort development of a beamline system for characterization of x ray and neutron optics
topic Physics.
url http://hdl.handle.net/1721.1/105627
work_keys_str_mv AT amesandrewoandrewowen developmentofabeamlinesystemforcharacterizationofxrayandneutronoptics