A data-driven approach to improving capacity utilization of semiconductor test equipment
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996.
| Main Author: | |
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/10567 |
| _version_ | 1826189442654666752 |
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| author | Bailey, Roberta L. (Roberta Lynn) |
| author2 | Charles Sodini, Stephen Graves. |
| author_facet | Charles Sodini, Stephen Graves. Bailey, Roberta L. (Roberta Lynn) |
| author_sort | Bailey, Roberta L. (Roberta Lynn) |
| collection | MIT |
| description | Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996. |
| first_indexed | 2024-09-23T08:14:44Z |
| format | Thesis |
| id | mit-1721.1/10567 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T08:14:44Z |
| publishDate | 2005 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/105672019-04-09T17:33:53Z A data-driven approach to improving capacity utilization of semiconductor test equipment Bailey, Roberta L. (Roberta Lynn) Charles Sodini, Stephen Graves. Sloan School of Management Sloan School of Management Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996. Includes bibliographical references (p. 77). by Roberta L. Bailey. M.S. 2005-08-18T16:55:24Z 2005-08-18T16:55:24Z 1996 1996 Thesis http://hdl.handle.net/1721.1/10567 36028585 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 88 p. 7771489 bytes 7771243 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Sloan School of Management Bailey, Roberta L. (Roberta Lynn) A data-driven approach to improving capacity utilization of semiconductor test equipment |
| title | A data-driven approach to improving capacity utilization of semiconductor test equipment |
| title_full | A data-driven approach to improving capacity utilization of semiconductor test equipment |
| title_fullStr | A data-driven approach to improving capacity utilization of semiconductor test equipment |
| title_full_unstemmed | A data-driven approach to improving capacity utilization of semiconductor test equipment |
| title_short | A data-driven approach to improving capacity utilization of semiconductor test equipment |
| title_sort | data driven approach to improving capacity utilization of semiconductor test equipment |
| topic | Sloan School of Management |
| url | http://hdl.handle.net/1721.1/10567 |
| work_keys_str_mv | AT baileyrobertalrobertalynn adatadrivenapproachtoimprovingcapacityutilizationofsemiconductortestequipment AT baileyrobertalrobertalynn datadrivenapproachtoimprovingcapacityutilizationofsemiconductortestequipment |