A data-driven approach to improving capacity utilization of semiconductor test equipment

A data-driven approach to improving capacity utilization of semiconductor test equipment

Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996.

Bibliographic Details
Main Author: Bailey, Roberta L. (Roberta Lynn)
Other Authors: Charles Sodini, Stephen Graves.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Sloan School of Management
Online Access:http://hdl.handle.net/1721.1/10567

Similar Items

Similar Items